Masakazu TAKAHASHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic field shielding plate, method for manufacturing sam...
- Patent number 11,690,208
- Issue date Jun 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Ichiro Miyano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic field shielding plate, method for manufacturing sam...
- Patent number 11,659,700
- Issue date May 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Ichiro Miyano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for processing sample, and charged particle ra...
- Patent number 9,666,408
- Issue date May 30, 2017
- Hitachi High-Technologies Corporation
- Shuichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic chuck mechanism and charged particle beam apparatus
- Patent number 9,401,297
- Issue date Jul 26, 2016
- Hitachi High-Technologies Corporation
- Yasushi Ebizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removing foreign substances in charged particle beam dev...
- Patent number 9,368,319
- Issue date Jun 14, 2016
- Hitachi High-Technologies Corporation
- Kazuma Tanii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection apparatus
- Patent number 7,504,627
- Issue date Mar 17, 2009
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Sample dimension-measuring method and charged particle beam apparatus
- Patent number 7,476,856
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection apparatus
- Patent number 7,256,400
- Issue date Aug 14, 2007
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electromagnetic Field Shielding Plate, Method for Manufacturing Sam...
- Publication number 20220007556
- Publication date Jan 6, 2022
- Hitachi High-Tech Corporation
- Ichiro MIYANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Processing Sample, and Charged Particle Ra...
- Publication number 20150340198
- Publication date Nov 26, 2015
- Hitachi High-Technologies Corporation
- Shuichi NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Removing Foreign Substances in Charged Particle Beam Dev...
- Publication number 20150279609
- Publication date Oct 1, 2015
- Hitachi High-Technologies Corporation
- Kazuma Tanii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus
- Publication number 20150262857
- Publication date Sep 17, 2015
- Hitachi High-Technologies Corporation
- Yasushi EBIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam inspection apparatus
- Publication number 20070272860
- Publication date Nov 29, 2007
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection apparatus
- Publication number 20050234672
- Publication date Oct 20, 2005
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Sample dimension-measuring method and charged particle beam apparatus
- Publication number 20050051721
- Publication date Mar 10, 2005
- Kenji Watanabe
- G01 - MEASURING TESTING

Masakazu TAKAHASHI

Person

Patents Grantslast 30 patents

Electromagnetic field shielding plate, method for manufacturing sam...

Electromagnetic field shielding plate, method for manufacturing sam...

Apparatus and method for processing sample, and charged particle ra...

Electrostatic chuck mechanism and charged particle beam apparatus

Method for removing foreign substances in charged particle beam dev...

Electron beam inspection apparatus

Sample dimension-measuring method and charged particle beam apparatus

Electron beam inspection apparatus

Patents Applicationslast 30 patents

Electromagnetic Field Shielding Plate, Method for Manufacturing Sam...

Apparatus and Method for Processing Sample, and Charged Particle Ra...

Method for Removing Foreign Substances in Charged Particle Beam Dev...

Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus

Electron beam inspection apparatus

Electron beam inspection apparatus

Sample dimension-measuring method and charged particle beam apparatus