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Masakazu Terada
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Chiryu, JP
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last 30 patents
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Patent Grant
Semiconductor substrate manufacturing method, semiconductor pressur...
Patent number
6,388,279
Issue date
May 14, 2002
Denso Corporation
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
Patent number
6,287,885
Issue date
Sep 11, 2001
Denso Corporation
Hiroshi Muto
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of producing a semiconductor dynamic sensor
Patent number
5,549,785
Issue date
Aug 27, 1996
Nippondenso Co., Ltd.
Minekazu Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Method of producing an acceleration sensor of a semiconductor
Patent number
5,223,086
Issue date
Jun 29, 1993
Nippondenso Co., Ltd.
Masakazu Terada
G01 - MEASURING TESTING