Masakazu Yanase

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Vancouver, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods, systems and apparatus for defect detection and classification
- Patent number 8,995,747
- Issue date Mar 31, 2015
- Sharp Laboratories of America, Inc.
- Xinyu Xu
- G01 - MEASURING TESTING
Information Patent Grant
System for feature detection for low contrast images
- Patent number 8,971,632
- Issue date Mar 3, 2015
- Sharp Laboratories of America, Inc.
- Masakazu Yanase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems and apparatus for defect detection
- Patent number 8,331,650
- Issue date Dec 11, 2012
- Sharp Laboratories of America, Inc.
- Chang Yuan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR FEATURE DETECTION FOR LOW CONTRAST IMAGES
- Publication number 20120045135
- Publication date Feb 23, 2012
- Sharp Laboratories of America, Inc.
- Masakazu Yanase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, Systems and Apparatus for Defect Detection and Classification
- Publication number 20120027286
- Publication date Feb 2, 2012
- Xinyu Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, Systems and Apparatus for Defect Detection
- Publication number 20120027288
- Publication date Feb 2, 2012
- Chang Yuan
- G06 - COMPUTING CALCULATING COUNTING