Membership
Tour
Register
Log in
Masaki CHIKAHISA
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automated sample inspection system and method for controlling same
Patent number
11,073,527
Issue date
Jul 27, 2021
HITACHI HIGH-TECH CORPORATION
Takeshi Matsuka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE, DISPLAY SYSTEM OF AUTOMATIC ANALYSIS DEV...
Publication number
20230056397
Publication date
Feb 23, 2023
HITACHI HIGH-TECH CORPORATION
Kazuaki SHIBA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME
Publication number
20190170780
Publication date
Jun 6, 2019
Hitachi High-Technologies Corporation
Takeshi MATSUKA
G01 - MEASURING TESTING