Masaki Fujiwara

Person

Osaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Display device and method for manufacturing same where a resin laye...
- Patent number 11,508,921
- Issue date Nov 22, 2022
- SHARP KABUSHIKI KAISHA
- Tetsuo Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 11,493,331
- Issue date Nov 8, 2022
- Keyence Corporation
- Takuya Karube
- G01 - MEASURING TESTING
Information Patent Grant
Display device and method for manufacturing display device
- Patent number 11,342,521
- Issue date May 24, 2022
- SHARP KABUSHIKI KAISHA
- Masaki Fujiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shape measuring device and shape measuring method
- Patent number 11,002,535
- Issue date May 11, 2021
- Keyence Corporation
- Kazuki Natori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measuring device and shape measuring method
- Patent number 10,746,539
- Issue date Aug 18, 2020
- Keyence Corporation
- Tsuyoshi Suenaga
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device generating point cloud data
- Patent number 10,739,130
- Issue date Aug 11, 2020
- Keyence Corporation
- Shigeto Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing thin-film element device and light irradiation...
- Patent number 10,535,843
- Issue date Jan 14, 2020
- SHARP KABUSHIKI KAISHA
- Tetsunori Tanaka
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical three-dimensional shape measuring device
- Patent number 10,323,933
- Issue date Jun 18, 2019
- Keyence Corporation
- Masaki Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 10,262,431
- Issue date Apr 16, 2019
- Keyence Corporation
- Jun Tabuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of producing component board
- Patent number 10,115,747
- Issue date Oct 30, 2018
- SHARP KABUSHIKI KAISHA
- Masaki Fujiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray image sensor substrate
- Patent number 9,780,140
- Issue date Oct 3, 2017
- SHARP KABUSHIKI KAISHA
- Masaki Fujiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopic imaging device, microscopic imaging method, and microsc...
- Patent number 9,772,483
- Issue date Sep 26, 2017
- Keyence Corporation
- Masaki Fujiwara
- G02 - OPTICS
Information Patent Grant
Image acquisition apparatus
- Patent number 8,144,189
- Issue date Mar 27, 2012
- Keyence Corporation
- Masaki Fujiwara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
REVERSE ENGINEERING SYSTEM
- Publication number 20240054253
- Publication date Feb 15, 2024
- KEYENCE CORPORATION
- Masaki Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE ENGINEERING SUPPORT APPARATUS
- Publication number 20240054252
- Publication date Feb 15, 2024
- KEYENCE CORPORATION
- Kazusa AOKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
- Publication number 20210041231
- Publication date Feb 11, 2021
- KEYENCE CORPORATION
- Takuya KARUBE
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE
- Publication number 20210036246
- Publication date Feb 4, 2021
- SHARP KABUSHIKI KAISHA
- MASAKI FUJIWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20210028378
- Publication date Jan 28, 2021
- SHARP KABUSHIKI KAISHA
- TETSUO FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shape Measuring Device And Shape Measuring Method
- Publication number 20190323829
- Publication date Oct 24, 2019
- KEYENCE CORPORATION
- Tsuyoshi Suenaga
- G01 - MEASURING TESTING
Information Patent Application
Shape Measuring Device And Shape Measuring Method
- Publication number 20190323831
- Publication date Oct 24, 2019
- KEYENCE CORPORATION
- Kazuki Natori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE SUBSTRATE, LIQUID CRYSTAL DISPLAY APPARATUS, AND DEVICE SUBS...
- Publication number 20190072808
- Publication date Mar 7, 2019
- SHARP KABUSHIKI KAISHA
- MASAKI FUJIWARA
- G02 - OPTICS
Information Patent Application
METHOD FOR PRODUCING THIN-FILM ELEMENT DEVICE AND LIGHT IRRADIATION...
- Publication number 20180108874
- Publication date Apr 19, 2018
- SHARP KABUSHIKI KAISHA
- Tetsunori TANAKA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Three-Dimensional Measurement Device
- Publication number 20170372489
- Publication date Dec 28, 2017
- KEYENCE CORPORATION
- Jun Tabuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring Device
- Publication number 20170370707
- Publication date Dec 28, 2017
- KEYENCE CORPORATION
- Shigeto Murakami
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device
- Publication number 20170370708
- Publication date Dec 28, 2017
- KEYENCE CORPORATION
- Masaki Fujiwara
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PRODUCING COMPONENT BOARD
- Publication number 20170365628
- Publication date Dec 21, 2017
- SHARP KABUSHIKI KAISHA
- MASAKI FUJIWARA
- B32 - LAYERED PRODUCTS
Information Patent Application
X-RAY IMAGE SENSOR SUBSTRATE
- Publication number 20160190202
- Publication date Jun 30, 2016
- Sharp Kabushiki Kaisha
- Masaki FUJIWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Display device and thin-film transistor substrate and method for pr...
- Publication number 20160062168
- Publication date Mar 3, 2016
- Sharp Kabushiki Kaisha
- Yasumori Fukushima
- G02 - OPTICS
Information Patent Application
Microscopic Imaging Device, Microscopic Imaging Method, And Microsc...
- Publication number 20150116478
- Publication date Apr 30, 2015
- KEYENCE CORPORATION
- Masaki Fujiwara
- G02 - OPTICS
Information Patent Application
DISPLAY DEVICE AND THIN FILM TRANSISTOR SUBSTRATE AND MANUFACTURING...
- Publication number 20130265530
- Publication date Oct 10, 2013
- Sharp Kabushiki Kaisha
- Yasumori Fukushima
- G02 - OPTICS
Information Patent Application
DISPLAY DEVICE
- Publication number 20120262660
- Publication date Oct 18, 2012
- Sharp Kabushiki Kaisha
- Masaki Fujiwara
- G02 - OPTICS
Information Patent Application
FLEXIBLE CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF
- Publication number 20120155038
- Publication date Jun 21, 2012
- Sharp Kabushiki Kaisha
- Yasumori Fukushima
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Image Acquisition Apparatus
- Publication number 20090002485
- Publication date Jan 1, 2009
- KEYENCE CORPORATION
- Masaki Fujiwara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Masaki Fujiwara

Person

Patents Grantslast 30 patents

Display device and method for manufacturing same where a resin laye...

Three-dimensional shape measuring apparatus, three-dimensional shap...

Display device and method for manufacturing display device

Shape measuring device and shape measuring method

Shape measuring device and shape measuring method

Optical measuring device generating point cloud data

Method for producing thin-film element device and light irradiation...

Optical three-dimensional shape measuring device

Three-dimensional measurement device

Method of producing component board

X-ray image sensor substrate

Microscopic imaging device, microscopic imaging method, and microsc...

Image acquisition apparatus

Patents Applicationslast 30 patents

REVERSE ENGINEERING SYSTEM

REVERSE ENGINEERING SUPPORT APPARATUS

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...

DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE

DISPLAY DEVICE AND METHOD FOR MANUFACTURING SAME

Shape Measuring Device And Shape Measuring Method

Shape Measuring Device And Shape Measuring Method

DEVICE SUBSTRATE, LIQUID CRYSTAL DISPLAY APPARATUS, AND DEVICE SUBS...

METHOD FOR PRODUCING THIN-FILM ELEMENT DEVICE AND LIGHT IRRADIATION...

Three-Dimensional Measurement Device

Measuring Device

Measuring Device

METHOD OF PRODUCING COMPONENT BOARD

X-RAY IMAGE SENSOR SUBSTRATE

Display device and thin-film transistor substrate and method for pr...

Microscopic Imaging Device, Microscopic Imaging Method, And Microsc...

DISPLAY DEVICE AND THIN FILM TRANSISTOR SUBSTRATE AND MANUFACTURING...

DISPLAY DEVICE

FLEXIBLE CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF

Image Acquisition Apparatus