Masaki Hirano

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Patents Grantslast 30 patents

Information Patent Grant
Particle measuring apparatus
- Patent number 10,317,330
- Issue date Jun 11, 2019
- TOSHIBA MEMORY CORPORATION
- Masaki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Particle detecting apparatus
- Patent number 9,885,648
- Issue date Feb 6, 2018
- TOSHIBA MEMORY CORPORATION
- Masaki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Particle measuring apparatus and particle measuring method
- Patent number 9,885,649
- Issue date Feb 6, 2018
- TOSHIBA MEMORY CORPORATION
- Yuichi Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Particle supply device and particle supply method
- Patent number 9,691,648
- Issue date Jun 27, 2017
- Kabushiki Kaisha Toshiba
- Masaki Hirano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE MEASURING APPARATUS
- Publication number 20170227443
- Publication date Aug 10, 2017
- Kabushiki Kaisha Toshiba
- Masaki HIRANO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTING APPARATUS
- Publication number 20170074792
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Masaki Hirano
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD
- Publication number 20170074774
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Yuichi KURODA
- G01 - MEASURING TESTING
Information Patent Application
Particle Supply Device and Particle Supply Method
- Publication number 20160074821
- Publication date Mar 17, 2016
- Kabushiki Kaisha Toshiba
- Masaki HIRANO
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL