Masaki Kouno

Follow

Person

Ome, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test method of semiconductor intergrated circuit and test pattern g...
- Patent number 6,922,803
- Issue date Jul 26, 2005
- Hitachi, Ltd.
- Michinobu Nakao
- G11 - INFORMATION STORAGE
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 6,670,201
- Issue date Dec 30, 2003
- Hitachi, Ltd.
- Masaki Kouno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test method of semiconductor intergrated circuit and test pattern g...
- Publication number 20020073373
- Publication date Jun 13, 2002
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20020036534
- Publication date Mar 28, 2002
- Hitachi, Ltd.
- Masaki Kouno
- G01 - MEASURING TESTING