Masaki Kurihara

Person

Tsuchiura, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for reviewing defects of semiconductor device
- Patent number 8,581,976
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classifier using classification recipe based on connection b...
- Patent number 8,452,076
- Issue date May 28, 2013
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classifier using classification recipe based on connection b...
- Patent number 8,150,141
- Issue date Apr 3, 2012
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classifier using classification recipe based on connection b...
- Patent number 7,991,217
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for reviewing defects of semiconductor device
- Patent number 7,873,202
- Issue date Jan 18, 2011
- Hitachi High-Technologies Corporation
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SEM-type reviewing apparatus and a method for reviewing defects usi...
- Patent number 7,598,490
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Masaki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam drawing apparatus
- Patent number 6,794,665
- Issue date Sep 21, 2004
- Hitachi High-Technologies Corporation
- Masaki Kurihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vibration testing system
- Patent number 6,598,480
- Issue date Jul 29, 2003
- Hitachi, Ltd.
- Toshihiko Horiuchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 6,403,968
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Eiichi Hazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shaking test method and system for a structure
- Patent number 5,737,239
- Issue date Apr 7, 1998
- Hitachi, Ltd.
- Toshihiko Horiuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION B...
- Publication number 20120128233
- Publication date May 24, 2012
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION B...
- Publication number 20110268345
- Publication date Nov 3, 2011
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus For Reviewing Defects of Semiconductor Device
- Publication number 20110102573
- Publication date May 5, 2011
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEM-TYPE REVIEWING APPARATUS AND A METHOD FOR REVIEWING DEFECTS USI...
- Publication number 20080067371
- Publication date Mar 20, 2008
- Masaki Kurihara
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reviewing defects
- Publication number 20070201739
- Publication date Aug 30, 2007
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for reviewing defects of semiconductor device
- Publication number 20070031026
- Publication date Feb 8, 2007
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and its apparatus for classifying defects
- Publication number 20060078188
- Publication date Apr 13, 2006
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron beam drawing apparatus
- Publication number 20030197134
- Publication date Oct 23, 2003
- Hitachi High-Technologies Corporation
- Masaki Kurihara
- B82 - NANO-TECHNOLOGY
Information Patent Application
VIBRATION TESTING SYSTEM
- Publication number 20030109992
- Publication date Jun 12, 2003
- Toshihiko Horiuchi
- G01 - MEASURING TESTING

Masaki Kurihara

Person

Patents Grantslast 30 patents

Method and apparatus for reviewing defects of semiconductor device

Defect classifier using classification recipe based on connection b...

Defect classifier using classification recipe based on connection b...

Defect classifier using classification recipe based on connection b...

Method and apparatus for reviewing defects of semiconductor device

SEM-type reviewing apparatus and a method for reviewing defects usi...

Electron beam drawing apparatus

Vibration testing system

Scanning electron microscope

Shaking test method and system for a structure

Patents Applicationslast 30 patents

DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION B...

DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION B...

Method and Apparatus For Reviewing Defects of Semiconductor Device

SEM-TYPE REVIEWING APPARATUS AND A METHOD FOR REVIEWING DEFECTS USI...

Method and apparatus for reviewing defects

Method and apparatus for reviewing defects of semiconductor device

Method and its apparatus for classifying defects

Electron beam drawing apparatus

VIBRATION TESTING SYSTEM