Masaki Morita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analyzer apparatus and method of image processing
- Patent number 12,154,254
- Issue date Nov 26, 2024
- Joel Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, analysis device, and image processing meth...
- Patent number 10,746,675
- Issue date Aug 18, 2020
- Jeol Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for computing amount of drift and charged particl...
- Patent number 9,773,315
- Issue date Sep 26, 2017
- Jeol Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope and elemental mapping image generation method
- Patent number 9,627,175
- Issue date Apr 18, 2017
- Jeol Ltd.
- Masaki Morita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector assembly and sample analyzer
- Patent number 9,188,686
- Issue date Nov 17, 2015
- Jeol Ltd.
- Masaki Morita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analyzer Apparatus and Method of Image Processing
- Publication number 20230024406
- Publication date Jan 26, 2023
- JEOL Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Device, Analysis Device, and Image Processing Method
- Publication number 20190041343
- Publication date Feb 7, 2019
- JEOL Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope and Elemental Mapping Image Generation Method
- Publication number 20160111248
- Publication date Apr 21, 2016
- JEOL Ltd.
- Masaki Morita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device and Method for Computing Amount of Drift and Charged Particl...
- Publication number 20160019696
- Publication date Jan 21, 2016
- JEOL Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION DETECTOR ASSEMBLY AND SAMPLE ANALYZER
- Publication number 20150276952
- Publication date Oct 1, 2015
- JEOL Ltd.
- Masaki Morita
- G01 - MEASURING TESTING