Masaki Mukai

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Monochromator and charged particle beam system
- Patent number 11,094,498
- Issue date Aug 17, 2021
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of controlling same
- Patent number 10,607,803
- Issue date Mar 31, 2020
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,276,342
- Issue date Apr 30, 2019
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of controlling same
- Patent number 10,134,561
- Issue date Nov 20, 2018
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of adjusting same
- Patent number 9,589,761
- Issue date Mar 7, 2017
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of adjusting monochromator
- Patent number 9,362,082
- Issue date Jun 7, 2016
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting transmission electron microscope
- Patent number 8,853,616
- Issue date Oct 7, 2014
- Jeol Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monochromator and Charged Particle Beam System
- Publication number 20200411273
- Publication date Dec 31, 2020
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Controlling Same
- Publication number 20190139734
- Publication date May 9, 2019
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20180301315
- Publication date Oct 18, 2018
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Controlling Same
- Publication number 20170330723
- Publication date Nov 16, 2017
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Adjusting Monochromator
- Publication number 20160079030
- Publication date Mar 17, 2016
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Adjusting Same
- Publication number 20160071683
- Publication date Mar 10, 2016
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Adjusting Transmission Electron Microscope
- Publication number 20130248699
- Publication date Sep 26, 2013
- JEOL Ltd.
- Masaki Mukai
- H01 - BASIC ELECTRIC ELEMENTS