Masaki NAKAMORI

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Musashino-shi, Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Permittivity measuring device and thickness measuring device
- Patent number 12,117,285
- Issue date Oct 15, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki Nakamori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
PERMITTIVITY MEASURING DEVICE AND THICKNESS MEASURING DEVICE
- Publication number 20230236005
- Publication date Jul 27, 2023
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING