Masaki SHIBA

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample measurement device and sample measurement method
- Patent number 12,078,648
- Issue date Sep 3, 2024
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Sample measurement device and sample measurement method
- Patent number 11,846,632
- Issue date Dec 19, 2023
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Sample measurement method and sample measurement device
- Patent number 11,754,580
- Issue date Sep 12, 2023
- Sysmex Corporation
- Shunsuke Ariyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Container rack, specimen analysis device, and specimen analysis method
- Patent number 11,726,028
- Issue date Aug 15, 2023
- Sysmex Corporation
- Kenji Yoshimura
- G01 - MEASURING TESTING
Information Patent Grant
Method of cleaning aspiration tube and specimen measuring apparatus
- Patent number 11,666,920
- Issue date Jun 6, 2023
- Sysmex Corporation
- Kota Misawa
- B08 - CLEANING
Information Patent Grant
Sample measuring system and sample measuring method
- Patent number 11,400,455
- Issue date Aug 2, 2022
- Sysmex Corporation
- Hiroki Kotake
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample analyzer and a sample analyzing method
- Patent number 9,915,594
- Issue date Mar 13, 2018
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 9,889,443
- Issue date Feb 13, 2018
- Sysmex Corporation
- Toshikatsu Fukuju
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample analyzer and a sample analyzing method
- Patent number 9,151,703
- Issue date Oct 6, 2015
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD
- Publication number 20200309801
- Publication date Oct 1, 2020
- SYSMEX CORPORATION
- Masaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CLEANING ASPIRATION TUBE AND SPECIMEN MEASURING APPARATUS
- Publication number 20200306804
- Publication date Oct 1, 2020
- SYSMEX CORPORATION
- Kota MISAWA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SPECIMEN MEASUREMENT DEVICE, SPECIMEN MEASUREMENT METHOD, AND NOZZLE
- Publication number 20200300879
- Publication date Sep 24, 2020
- SYSMEX CORPORATION
- Masato KUZE
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER RACK, SPECIMEN ANALYSIS DEVICE, AND SPECIMEN ANALYSIS METHOD
- Publication number 20200271567
- Publication date Aug 27, 2020
- SYSMEX CORPORATION
- Kenji YOSHIMURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING SYSTEM AND SAMPLE MEASURING METHOD
- Publication number 20190232296
- Publication date Aug 1, 2019
- SYSMEX CORPORATION
- Hiroki KOTAKE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD
- Publication number 20190204304
- Publication date Jul 4, 2019
- SYSMEX CORPORATION
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASUREMENT METHOD AND SAMPLE MEASUREMENT DEVICE
- Publication number 20190204349
- Publication date Jul 4, 2019
- SYSMEX CORPORATION
- Shunsuke ARIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20190201904
- Publication date Jul 4, 2019
- SYSMEX CORPORATION
- Hironori KATSUMI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD
- Publication number 20150330878
- Publication date Nov 19, 2015
- Sysmex Corporation
- Masaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
- Publication number 20150273464
- Publication date Oct 1, 2015
- SYSMEX CORPORATION
- Toshikatsu FUKUJU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD
- Publication number 20130189708
- Publication date Jul 25, 2013
- SYSMEX CORPORATION
- Masaki SHIBA
- G01 - MEASURING TESTING

Masaki SHIBA

Person

Patents Grantslast 30 patents

Sample measurement device and sample measurement method

Sample measurement device and sample measurement method

Sample measurement method and sample measurement device

Container rack, specimen analysis device, and specimen analysis method

Method of cleaning aspiration tube and specimen measuring apparatus

Sample measuring system and sample measuring method

Sample analyzer and a sample analyzing method

Sample analyzer and sample analyzing method

Sample analyzer and a sample analyzing method

Patents Applicationslast 30 patents

SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD

METHOD OF CLEANING ASPIRATION TUBE AND SPECIMEN MEASURING APPARATUS

SPECIMEN MEASUREMENT DEVICE, SPECIMEN MEASUREMENT METHOD, AND NOZZLE

CONTAINER RACK, SPECIMEN ANALYSIS DEVICE, AND SPECIMEN ANALYSIS METHOD

SAMPLE MEASURING SYSTEM AND SAMPLE MEASURING METHOD

SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD

SAMPLE MEASUREMENT METHOD AND SAMPLE MEASUREMENT DEVICE

SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD

SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD

SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD

SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD