Masaki Tatsumi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspecting method and inspection apparatus for membraneelectrode as...
- Patent number 11,460,417
- Issue date Oct 4, 2022
- Toyota Jidosha Kabushiki Kaisha
- Shinya Takeshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection apparatus and x-ray inspection method
- Patent number 10,989,674
- Issue date Apr 27, 2021
- Hitachi High-Tech Science Corporation
- Masaki Tatsumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...
- Publication number 20230417691
- Publication date Dec 28, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yuki KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING METHOD AND INSPECTION APPARATUS FOR MEMBRANEELECTRODE AS...
- Publication number 20210262949
- Publication date Aug 26, 2021
- Toyota Jidosha Kabushiki Kaisha
- Shinya TAKESHITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20200284738
- Publication date Sep 10, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masaki Tatsumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE