Masaki Tomiya

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Zushi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Linear scale
- Patent number 7,934,324
- Issue date May 3, 2011
- Mitutoyo Corporation
- Masaki Tomiya
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring device with interference grating
- Patent number 6,956,654
- Issue date Oct 18, 2005
- Mitutoyo Corporation
- Motohiro Osaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus wherein diffracted light does not return to the source
- Patent number 5,424,829
- Issue date Jun 13, 1995
- Mitutoyo Corporation
- Soichi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor including a heat insulating member partitioning...
- Patent number 5,386,291
- Issue date Jan 31, 1995
- Mitutoyo Corporation
- Soichi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Laser measuring apparatus
- Patent number 5,058,119
- Issue date Oct 15, 1991
- Mitutoyo Corporation
- Masamichi Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LINEAR SCALE
- Publication number 20100242295
- Publication date Sep 30, 2010
- Mitutoyo Corporation
- Masaki Tomiya
- G01 - MEASURING TESTING
Information Patent Application
Displacement measuring device with interference grating
- Publication number 20030160966
- Publication date Aug 28, 2003
- Mitutoyo Corporation
- Motohiro Osaki
- G01 - MEASURING TESTING