Masaki Tsuchihashi

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of operating scanning probe microscope
- Patent number 6,596,992
- Issue date Jul 22, 2003
- Seiko Instruments Inc.
- Kazunori Ando
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope
- Publication number 20020088937
- Publication date Jul 11, 2002
- Kazunori Ando
- B82 - NANO-TECHNOLOGY