Masako Kato

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Yokohama, JP

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Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CHIP USED FOR EVALUATION, EVALUATION SYSTEM, AND REPA...
- Publication number 20110237001
- Publication date Sep 29, 2011
- Takehiko HASEBE
- G01 - MEASURING TESTING
Information Patent Application
Pattern Formation Method
- Publication number 20090111062
- Publication date Apr 30, 2009
- HITACHI VIA MECHANICS, LTD.
- Masako Kato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR