Masako Nishimura

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 10,020,163
- Issue date Jul 10, 2018
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample image acquiring method
- Patent number 9,741,526
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display screen with graphical user interface
- Patent number D778920
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774045
- Issue date Dec 13, 2016
- HITACHI HIGH-TECHNOLOGIES CORPROATION
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774074
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774046
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 9,443,694
- Issue date Sep 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for observing samples and preprocessing thereof
- Patent number 9,086,343
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,058,957
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for scanning electron microscope observation of sample float...
- Patent number 8,698,079
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20160343542
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Image Acquiring Method
- Publication number 20160203944
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150076348
- Publication date Mar 19, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF
- Publication number 20140370540
- Publication date Dec 18, 2014
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140131590
- Publication date May 15, 2014
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...
- Publication number 20130221217
- Publication date Aug 29, 2013
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE A...
- Publication number 20120326033
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low vacuum scanning electron microscope
- Publication number 20060011834
- Publication date Jan 19, 2006
- Masako Nishimura
- H01 - BASIC ELECTRIC ELEMENTS

Masako Nishimura

Person

Patents Grantslast 30 patents

Charged particle beam apparatus, specimen observation system and op...

Charged particle beam apparatus and sample image acquiring method

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Charged particle beam apparatus, specimen observation system and op...

Methods for observing samples and preprocessing thereof

Charged particle beam apparatus

Method for scanning electron microscope observation of sample float...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

Charged Particle Beam Apparatus and Sample Image Acquiring Method

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF

CHARGED PARTICLE BEAM APPARATUS

METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...

METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE A...

Low vacuum scanning electron microscope