Masami Hori

Person

  • Osaka, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Micro relay

    • Patent number 7,482,900
    • Issue date Jan 27, 2009
    • Matsushita Electric Works, Ltd.
    • Takeshi Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Micro-relay

    • Patent number 7,102,473
    • Issue date Sep 5, 2006
    • Matsushita Electric Works, Ltd.
    • Kouji Sakai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Flexible sensor package responsive to thermally induced distortion

    • Patent number 6,906,412
    • Issue date Jun 14, 2005
    • Matsushita Electric Works, Ltd.
    • Eiichi Furukubo
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Acceleration sensor

    • Patent number 6,755,081
    • Issue date Jun 29, 2004
    • Matsushita Electric Works, Ltd.
    • Eiichi Furukubo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pressure sensor

    • Patent number 6,070,469
    • Issue date Jun 6, 2000
    • Matsushita Electric Works, Ltd.
    • Naohiro Taniguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Polarized electromagnetic relay

    • Patent number 4,933,654
    • Issue date Jun 12, 1990
    • Matsushita Electric Works, Ltd.
    • Masami Hori
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Micro relay

    • Publication number 20060250201
    • Publication date Nov 9, 2006
    • Takeshi Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Micro-relay

    • Publication number 20050156696
    • Publication date Jul 21, 2005
    • Kouji Sakai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sensor package

    • Publication number 20040232507
    • Publication date Nov 25, 2004
    • Eiichi Furukubo
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Acceleration sensor

    • Publication number 20030183004
    • Publication date Oct 2, 2003
    • Eiichi Furukubo
    • G01 - MEASURING TESTING