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Masami Iida
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Nagasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
State of charge computation system
Patent number
9,026,389
Issue date
May 5, 2015
Mitsubishi Heavy Industries, Ltd.
Tetsuro Shigemizu
G01 - MEASURING TESTING
Information
Patent Grant
Battery state-of-charge calculation device
Patent number
8,994,334
Issue date
Mar 31, 2015
Mitsubishi Heavy Industries, Ltd.
Tetsuro Shigemizu
G01 - MEASURING TESTING
Information
Patent Grant
Film-thickness measurement method and apparatus therefor, and thin-...
Patent number
8,184,303
Issue date
May 22, 2012
Mitsubishi Heavy Industries, Ltd.
Satoshi Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Film quality evaluation method, apparatus therefor, and production...
Patent number
7,907,276
Issue date
Mar 15, 2011
Mitsubishi Heavy Industries, Ltd.
Satoshi Sakai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STATE OF CHARGE COMPUTATION SYSTEM
Publication number
20120310563
Publication date
Dec 6, 2012
Mitsubishi Heavy Industries, Ltd.
Tetsuro Shigemizu
G01 - MEASURING TESTING
Information
Patent Application
BATTERY STATE-OF-CHARGE CALCULATION DEVICE
Publication number
20120086405
Publication date
Apr 12, 2012
KYUSHU ELECTRIC POWER CO., INC.
Tetsuro Shigemizu
G01 - MEASURING TESTING
Information
Patent Application
FILM-THICKNESS MEASUREMENT METHOD AND APPARATUS THEREFOR, AND THIN-...
Publication number
20100177326
Publication date
Jul 15, 2010
Mitsubishi Heavy Industries, Ltd.
Satoshi Sakai
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
FILM QUALITY EVALUATION METHOD, APPARATUS THEREFOR, AND PRODUCTION...
Publication number
20100067010
Publication date
Mar 18, 2010
Mitsubishi Heavy Industries , Ltd.
Satoshi Sakai
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH SELECTION METHOD, FILM THICKNESS MEASUREMENT METHOD, FIL...
Publication number
20100033735
Publication date
Feb 11, 2010
Mitsubishi Heavy Industries, Ltd.
Satoshi SAKAI
G01 - MEASURING TESTING