Masami Iizuka

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Ishioka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Lighting optical machine and defect inspection system
- Patent number 7,417,720
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Masami Iizuka
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,348,558
- Issue date Mar 25, 2008
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Lighting optical machine and defect inspection system
- Patent number 7,133,127
- Issue date Nov 7, 2006
- Hitachi High-Technologies Corporation
- Masami Iizuka
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,030,394
- Issue date Apr 18, 2006
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 6,825,480
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Lighting optical machine and defect inspection system
- Publication number 20070008521
- Publication date Jan 11, 2007
- Masami Iizuka
- G01 - MEASURING TESTING
Information Patent Application
Lighting optical machine and defect inspection system
- Publication number 20040008341
- Publication date Jan 15, 2004
- Masami Iizuka
- G01 - MEASURING TESTING