Masami Ikota

Person

Higashiyamato-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern shape evaluation device, pattern shape evaluation system, a...
- Patent number 11,713,963
- Issue date Aug 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device, image processing method and charged partic...
- Patent number 11,430,106
- Issue date Aug 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, image processing device and inspection method
- Patent number 10,943,762
- Issue date Mar 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 10,672,119
- Issue date Jun 2, 2020
- HITACHI HIGH-TECH CORPORATION
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement method and measurement apparatus
- Patent number 10,295,339
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Kazuhisa Hasumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for pattern measurement, method for setting device parameter...
- Patent number 9,831,062
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Makoto Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface measurement apparatus
- Patent number 9,823,065
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Takanori Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and defect inspection system
- Patent number 8,358,406
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Masami Ikota
- G01 - MEASURING TESTING
Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and apparatus for repeated micro-miniature patterns
- Patent number 6,661,912
- Issue date Dec 9, 2003
- Hitachi Electronics Engineering Co., Ltd.
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 6,365,425
- Issue date Apr 2, 2002
- Hitachi, Ltd.
- Masami Ikota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM
- Publication number 20230230886
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Kenji YASUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION BEAM DEVICE
- Publication number 20220301812
- Publication date Sep 22, 2022
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATION SYSTEM, A...
- Publication number 20220034653
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...
- Publication number 20200219243
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Takeyoshi OHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM, IMAGE PROCESSING DEVICE AND INSPECTION METHOD
- Publication number 20190244783
- Publication date Aug 8, 2019
- Hitachi High-Technologies Corporation
- Takeyoshi OHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20180308228
- Publication date Oct 25, 2018
- Hitachi High-Technologies Corporation
- Atsuko YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Measurement Method and Measurement Apparatus
- Publication number 20170030712
- Publication date Feb 2, 2017
- Hitachi High-Technologies Corporation
- Kazuhisa HASUMI
- G01 - MEASURING TESTING
Information Patent Application
Surface Measurement Apparatus
- Publication number 20150354947
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Takanori KONDO
- G01 - MEASURING TESTING
Information Patent Application
Method for Pattern Measurement, Method for Setting Device Parameter...
- Publication number 20150357158
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Makoto SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20090180109
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Masami Ikota
- G01 - MEASURING TESTING
Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING

Masami Ikota

Person

Patents Grantslast 30 patents

Pattern shape evaluation device, pattern shape evaluation system, a...

Image processing device, image processing method and charged partic...

Inspection system, image processing device and inspection method

Inspection device

Pattern measurement method and measurement apparatus

Method for pattern measurement, method for setting device parameter...

Surface measurement apparatus

Defect inspection method and defect inspection system

Process management system

Inspecting method and apparatus for repeated micro-miniature patterns

Process control system

Method of manufacturing semiconductor device

Patents Applicationslast 30 patents

PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM

ION BEAM DEVICE

PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATION SYSTEM, A...

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...

INSPECTION SYSTEM, IMAGE PROCESSING DEVICE AND INSPECTION METHOD

INSPECTION DEVICE

Pattern Measurement Method and Measurement Apparatus

Surface Measurement Apparatus

Method for Pattern Measurement, Method for Setting Device Parameter...

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

Process management system