Masami MAKUUCHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,044,627
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaya Yamamoto
- G02 - OPTICS
Information Patent Grant
Inspection device and inspection method thereof
- Patent number 11,346,791
- Issue date May 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Medium sensor device and monitoring system
- Patent number 11,199,511
- Issue date Dec 14, 2021
- Hitachi, Ltd.
- Kazuki Ikeda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Defect inspection device
- Patent number 11,143,600
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,143,598
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,830,706
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,458,924
- Issue date Oct 29, 2019
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- G01 - MEASURING TESTING
Information Patent Grant
Examination device
- Patent number 10,401,304
- Issue date Sep 3, 2019
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Examination device
- Patent number 10,107,762
- Issue date Oct 23, 2018
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and measurement device
- Patent number 9,779,912
- Issue date Oct 3, 2017
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Driver integrated circuit
- Patent number 9,698,783
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Wen Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Weak signal detection system and electron microscope equipped with...
- Patent number 9,576,769
- Issue date Feb 21, 2017
- Hitachi, Ltd.
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection equipment and inspection method
- Patent number 9,261,475
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 8,908,171
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectroscope and its adjusting method
- Patent number 8,563,925
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wideband low noise sensor amplifier circuit
- Patent number 8,451,063
- Issue date May 28, 2013
- Hitachi, Ltd.
- Masayoshi Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Contamination-inspecting apparatus and detection circuit
- Patent number 8,035,071
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method of magnetic disk or magn...
- Patent number 8,000,045
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Inspection apparatus and inspection method of magnetic disk or magn...
- Patent number 8,000,047
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection circuit and foreign matter inspection apparatus for semic...
- Patent number 7,990,529
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, testing and manufacturing methods thereof
- Patent number 7,668,027
- Issue date Feb 23, 2010
- Renesas Technology Corp.
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and testing method thereof
- Patent number 7,474,290
- Issue date Jan 6, 2009
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and the method of testing the same
- Patent number 7,443,373
- Issue date Oct 28, 2008
- Renesas Technology Corp.
- Kengo Imagawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and testing method of semiconductor device
- Patent number 7,358,953
- Issue date Apr 15, 2008
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Magnetic characteristic inspecting apparatus and inspecting method...
- Patent number 7,276,900
- Issue date Oct 2, 2007
- Hitachi High-Technologies Corporation
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Narrow-directivity electromagnetic-field antenna probe, and electro...
- Patent number 7,132,997
- Issue date Nov 7, 2006
- Hitachi, Ltd.
- Kouichi Uesaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MED...
- Patent number 6,894,489
- Issue date May 17, 2005
- Hitachi, Ltd.
- Masami Makuuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus of magnetic recording medium or magnetic head inc...
- Patent number 6,700,369
- Issue date Mar 2, 2004
- Hitachi, Ltd.
- Masami Makuuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Reader/writer having coil arrangements to restrain electromagnetic...
- Patent number 6,176,433
- Issue date Jan 23, 2001
- Hitachi, Ltd.
- Kouichi Uesaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power transmission system, power transmission/communication system...
- Patent number 6,164,532
- Issue date Dec 26, 2000
- Hitachi, Ltd.
- Takashi Suga
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL FOREIGN MATTER INSPECTION DEVICE
- Publication number 20240044806
- Publication date Feb 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device
- Publication number 20240027361
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Kazuhide SATO
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20230175979
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20220317058
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Masaya YAMAMOTO
- G02 - OPTICS
Information Patent Application
MEDIUM SENSOR DEVICE AND MONITORING SYSTEM
- Publication number 20210109037
- Publication date Apr 15, 2021
- Hitachi, Ltd
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20210025829
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD THEREOF
- Publication number 20200393388
- Publication date Dec 17, 2020
- Hitachi High-Tech Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20200371047
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20200256804
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20190178813
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION DEVICE
- Publication number 20190033228
- Publication date Jan 31, 2019
- Hitachi High-Technologies Corporation
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION DEVICE
- Publication number 20180017502
- Publication date Jan 18, 2018
- Hitachi High-Technologies Corporation
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device and Measurement Device
- Publication number 20160322193
- Publication date Nov 3, 2016
- Hitachi High-Technologies Corporation
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
Weak Signal Detection System and Electron Microscope Equipped with...
- Publication number 20160211110
- Publication date Jul 21, 2016
- Hitachi, Ltd
- Hisaaki KANAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20150293034
- Publication date Oct 15, 2015
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Minute Signal Detection Method and System
- Publication number 20150012249
- Publication date Jan 8, 2015
- HITACHI LTD.
- Wen Li
- G01 - MEASURING TESTING
Information Patent Application
Driver Integrated Circuit
- Publication number 20140125398
- Publication date May 8, 2014
- Hitachi, Ltd
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20130286387
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectroscope and its Adjusting Method
- Publication number 20130200256
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Equipment and Inspection Method
- Publication number 20130187667
- Publication date Jul 25, 2013
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20120313650
- Publication date Dec 13, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERNED MEDIUM INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20120194939
- Publication date Aug 2, 2012
- Takuma NISHIMOTO
- G11 - INFORMATION STORAGE
Information Patent Application
WIDEBAND LOW NOISE SENSOR AMPLIFIER CIRCUIT
- Publication number 20120075021
- Publication date Mar 29, 2012
- Hitachi, Ltd
- Masayoshi Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTING CIRCUIT AND INSPECTING APPARATUS
- Publication number 20110211277
- Publication date Sep 1, 2011
- Takuma NISHIMOTO
- G11 - INFORMATION STORAGE
Information Patent Application
Inspection Apparatus and Inspection Method of Magnetic Disk or Magn...
- Publication number 20100067135
- Publication date Mar 18, 2010
- Masami MAKUUCHI
- G11 - INFORMATION STORAGE
Information Patent Application
Inspection Apparatus and Inspection Method of Magnetic Disk or Magn...
- Publication number 20100033862
- Publication date Feb 11, 2010
- Masayoshi TAKAHASHI
- G11 - INFORMATION STORAGE
Information Patent Application
DETECTION CIRCUIT AND FOREIGN MATTER INSPECTION APPARATUS FOR SEMIC...
- Publication number 20090122305
- Publication date May 14, 2009
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT
- Publication number 20080278717
- Publication date Nov 13, 2008
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device, testing and manufacturing methods thereof
- Publication number 20070047345
- Publication date Mar 1, 2007
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic characteristic inspecting apparatus and inspecting method...
- Publication number 20060132122
- Publication date Jun 22, 2006
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE

Masami MAKUUCHI

Person

Patents Grantslast 30 patents

Defect inspection device and defect inspection method

Inspection device and inspection method thereof

Medium sensor device and monitoring system

Defect inspection device

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and defect inspection method

Inspection apparatus and inspection method

Examination device

Examination device

Inspection device and measurement device

Driver integrated circuit

Weak signal detection system and electron microscope equipped with...

Inspection equipment and inspection method

Defect inspection method and defect inspection device

Mass spectroscope and its adjusting method

Wideband low noise sensor amplifier circuit

Contamination-inspecting apparatus and detection circuit

Inspection apparatus and inspection method of magnetic disk or magn...

Inspection apparatus and inspection method of magnetic disk or magn...

Detection circuit and foreign matter inspection apparatus for semic...

Semiconductor device, testing and manufacturing methods thereof

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Magnetic characteristic inspecting apparatus and inspecting method...

Narrow-directivity electromagnetic-field antenna probe, and electro...

TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MED...

Testing apparatus of magnetic recording medium or magnetic head inc...

Reader/writer having coil arrangements to restrain electromagnetic...

Power transmission system, power transmission/communication system...

Patents Applicationslast 30 patents

OPTICAL FOREIGN MATTER INSPECTION DEVICE

Defect Inspection Device

Defect Inspection Apparatus and Defect Inspection Method

Defect Inspection Device and Defect Inspection Method

MEDIUM SENSOR DEVICE AND MONITORING SYSTEM

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD THEREOF

DEFECT INSPECTION DEVICE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

EXAMINATION DEVICE

EXAMINATION DEVICE

Inspection Device and Measurement Device

Weak Signal Detection System and Electron Microscope Equipped with...

INSPECTION DEVICE AND INSPECTION METHOD

Minute Signal Detection Method and System

Driver Integrated Circuit

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

Mass Spectroscope and its Adjusting Method

Inspection Equipment and Inspection Method

INSPECTION DEVICE AND INSPECTION METHOD

PATTERNED MEDIUM INSPECTION METHOD AND INSPECTION APPARATUS

WIDEBAND LOW NOISE SENSOR AMPLIFIER CIRCUIT

DETECTING CIRCUIT AND INSPECTING APPARATUS

Inspection Apparatus and Inspection Method of Magnetic Disk or Magn...

Inspection Apparatus and Inspection Method of Magnetic Disk or Magn...

DETECTION CIRCUIT AND FOREIGN MATTER INSPECTION APPARATUS FOR SEMIC...

CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT

Semiconductor device, testing and manufacturing methods thereof

Magnetic characteristic inspecting apparatus and inspecting method...