Masami Nishio

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Kagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for displaying defect in central area of monitor
- Patent number 5,377,279
- Issue date Dec 27, 1994
- Futec Inc.
- Hideyuki Hanafusa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of matching patterns and apparatus therefor
- Patent number 5,253,306
- Issue date Oct 12, 1993
- Futec Inc.
- Masami Nishio
- G06 - COMPUTING CALCULATING COUNTING