Masami Yamamoto

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contact probe and electrical connection jig
- Patent number 11,415,599
- Issue date Aug 16, 2022
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Cylindrical body and method for producing same
- Patent number 11,408,915
- Issue date Aug 9, 2022
- Nidec-Read Corporation
- Masami Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe
- Patent number 10,782,317
- Issue date Sep 22, 2020
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Connection terminal and connection jig
- Patent number 9,069,012
- Issue date Jun 30, 2015
- Nidec-Read Corporation
- Akihiro Yano
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device and substrate inspecting method
- Patent number 7,202,690
- Issue date Apr 10, 2007
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CYLINDRICAL BODY AND METHOD FOR PRODUCING SAME
- Publication number 20210035701
- Publication date Feb 4, 2021
- NIDEC-READ CORPORATION
- Masami YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING MI ELEMENT AND MI ELEMENT
- Publication number 20200300930
- Publication date Sep 24, 2020
- Masami YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE AND ELECTRICAL CONNECTION JIG
- Publication number 20190383858
- Publication date Dec 19, 2019
- NIDEC-READ CORPORATION
- Masami YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20180340960
- Publication date Nov 29, 2018
- NIDEC-READ CORPORATION
- Masami YAMAMOTO
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
INSPECTION JIG AND CONTACT
- Publication number 20140028343
- Publication date Jan 30, 2014
- Kiyoshi NUMATA
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION TERMINAL AND CONNECTION JIG
- Publication number 20130057308
- Publication date Mar 7, 2013
- NIDEC-READ CORPORATION
- Akihiro YANO
- G01 - MEASURING TESTING
Information Patent Application
Substrate inspection device and substrate inspecting method
- Publication number 20060017452
- Publication date Jan 26, 2006
- Masami Yamamoto
- G01 - MEASURING TESTING