Masami Yoneda

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Saitama-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of interference fringe analysis for determining aspect of su...
- Patent number 5,523,842
- Issue date Jun 4, 1996
- Fuji Photo Optical Co., Ltd.
- Kenji Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Alignment verification system for use with interferometer and havin...
- Patent number 5,471,305
- Issue date Nov 28, 1995
- Fuji Photo Optical Co., Ltd.
- Masami Yoneda
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric surface inspection machine designed to support an e...
- Patent number 5,377,007
- Issue date Dec 27, 1994
- Fuji Photo Optical Co., Ltd.
- Kenji Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Beam shifting device
- Patent number 5,299,049
- Issue date Mar 29, 1994
- Fuji Photo Optical Co., Ltd.
- Takayuki Saito
- G02 - OPTICS