Masamichi Fujihira

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe microscope system suitable for observing sample of long body
- Patent number 7,507,957
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Grant
Scanning near-field optic/atomic force microscope
- Patent number 6,229,609
- Issue date May 8, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Three-dimensional scanning probe microscope
- Patent number 6,215,121
- Issue date Apr 10, 2001
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical probe, method of manufacturing an optical probe, and scanni...
- Patent number 6,121,604
- Issue date Sep 19, 2000
- The Head of Agency of Industrial Science and Technology
- Takashi Hiraga
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical memory medium
- Patent number 5,654,131
- Issue date Aug 5, 1997
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical information read/write apparatus
- Patent number 5,513,168
- Issue date Apr 30, 1996
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine surface observing apparatus
- Patent number 5,449,901
- Issue date Sep 12, 1995
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High resolution observation apparatus with photon scanning microscope
- Patent number 5,304,795
- Issue date Apr 19, 1994
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe microscope system suitable for observing sample of long body
- Publication number 20060060778
- Publication date Mar 23, 2006
- Masamichi Fujihira
- G01 - MEASURING TESTING

Masamichi Fujihira

Person

Patents Grantslast 30 patents

Probe microscope system suitable for observing sample of long body

Scanning near-field optic/atomic force microscope

Three-dimensional scanning probe microscope

Optical probe, method of manufacturing an optical probe, and scanni...

Optical memory medium

Optical information read/write apparatus

Fine surface observing apparatus

High resolution observation apparatus with photon scanning microscope

Patents Applicationslast 30 patents

Probe microscope system suitable for observing sample of long body