Masamichi Oi

Person

Chiba-chi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Composite system of scanning electron microscope and focused ion beam
- Patent number 7,154,106
- Issue date Dec 26, 2006
- SII NanoTechnology Inc.
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EPL mask processing method and device thereof
- Patent number 7,060,397
- Issue date Jun 13, 2006
- SII NanoTechnology Inc.
- Yo Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen analyzing method
- Patent number 6,934,920
- Issue date Aug 23, 2005
- SII NanoTechnology Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fine stencil structure correction device
- Patent number 6,825,468
- Issue date Nov 30, 2004
- SII NanoTechnology Inc.
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charge particle beam apparatus
- Patent number 6,486,471
- Issue date Nov 26, 2002
- Seiko Instruments Inc.
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion source and method for measuring flow impedance of...
- Patent number 6,472,881
- Issue date Oct 29, 2002
- Seiko Instruments Inc.
- Yasuhiko Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 6,452,172
- Issue date Sep 17, 2002
- Seiko Instruments Inc.
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle apparatus
- Patent number 6,452,173
- Issue date Sep 17, 2002
- Seiko Instruments Inc.
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Fine stencil structure correction device
- Publication number 20040031936
- Publication date Feb 19, 2004
- Masamichi Oi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen analyzing method
- Publication number 20030145291
- Publication date Jul 31, 2003
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS

Masamichi Oi

Person

Patents Grantslast 30 patents

Composite system of scanning electron microscope and focused ion beam

EPL mask processing method and device thereof

Specimen analyzing method

Fine stencil structure correction device

Composite charge particle beam apparatus

Liquid metal ion source and method for measuring flow impedance of...

Composite charged particle beam apparatus

Charged particle apparatus

Patents Applicationslast 30 patents

Fine stencil structure correction device

Specimen analyzing method