Masamichi Shiono

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Methods for observing samples and preprocessing thereof
- Patent number 9,086,343
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning electron microscope observation of sample float...
- Patent number 8,698,079
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF
- Publication number 20140370540
- Publication date Dec 18, 2014
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...
- Publication number 20130221217
- Publication date Aug 29, 2013
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE A...
- Publication number 20120326033
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- H01 - BASIC ELECTRIC ELEMENTS