Masamune Takeda

Person

Aichi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Millimetric wave imaging device and captured image display device
- Patent number 8,208,687
- Issue date Jun 26, 2012
- Masprodenkoh Kabushikikaisha
- Masamune Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Interference exclusion capability testing apparatus
- Patent number 7,999,560
- Issue date Aug 16, 2011
- Masprodenkoh Kabushikikaisha
- Toshihiro Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
EMC intense electric field antenna
- Patent number D611459
- Issue date Mar 9, 2010
- Masprodenkoh Kabushikikaisha
- Masamune Takeda
- D14 - Recording, communication, or information retrieval equipment

Patents Applicationslast 30 patents

Information Patent Application
Millimeter Wave Imaging Sensor
- Publication number 20120168625
- Publication date Jul 5, 2012
- Masprodenkoh Kabushikikaisha
- Jun Uemura
- G01 - MEASURING TESTING
Information Patent Application
Millimeter Wave Imaging Apparatus and Program
- Publication number 20120075479
- Publication date Mar 29, 2012
- Masprodenkoh Kabushikikaisha
- Jun Uemura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Millimeter Wave Imaging Apparatus
- Publication number 20110260905
- Publication date Oct 27, 2011
- MASPRODENKOH KABUSHIKIKAISHA
- Jun Uemura
- G01 - MEASURING TESTING
Information Patent Application
MILLIMETER WAVE IMAGING APPARATUS
- Publication number 20110234783
- Publication date Sep 29, 2011
- MASPRODENKOH KABUSHIKIKAISHA
- Jun Uemura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Millimeter Wave Imaging Apparatus
- Publication number 20110163876
- Publication date Jul 7, 2011
- MASPRODENKOH KABUSHIKIKAISHA
- Jun Uemura
- G01 - MEASURING TESTING
Information Patent Application
MILLIMETRIC WAVE IMAGING DEVICE AND CAPTURED IMAGE DISPLAY DEVICE
- Publication number 20100104193
- Publication date Apr 29, 2010
- Masprodenkoh Kabushikikaisha
- Masamune Takeda
- G01 - MEASURING TESTING
Information Patent Application
Interference Exclusion Capability Testing Apparatus
- Publication number 20090140750
- Publication date Jun 4, 2009
- MASPRODENKON KABUSHIKIKAISHA
- Toshihiro Sugiura
- G01 - MEASURING TESTING

Masamune Takeda

Person

Patents Grantslast 30 patents

Millimetric wave imaging device and captured image display device

Interference exclusion capability testing apparatus

EMC intense electric field antenna

Patents Applicationslast 30 patents

Millimeter Wave Imaging Sensor

Millimeter Wave Imaging Apparatus and Program

Millimeter Wave Imaging Apparatus

MILLIMETER WAVE IMAGING APPARATUS

Millimeter Wave Imaging Apparatus

MILLIMETRIC WAVE IMAGING DEVICE AND CAPTURED IMAGE DISPLAY DEVICE

Interference Exclusion Capability Testing Apparatus