Masanari Furiki

Follow

Person

Suita, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 9,362,083
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,081,625
- Issue date Jul 25, 2006
- Hitachi High-Technologies Corporation
- Masanari Furiki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
- Publication number 20150221470
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20050194536
- Publication date Sep 8, 2005
- Masanari Furiki
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20040129879
- Publication date Jul 8, 2004
- Masanari Furiki
- G01 - MEASURING TESTING