Masanari Koguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substitution site measuring equipment and substitution site measuri...
- Patent number 10,627,354
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Yoshihiro Anan
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating structural change during production process,...
- Patent number 10,088,450
- Issue date Oct 2, 2018
- Hitachi, Ltd.
- Takeshi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle-beam analysis device and analysis method
- Patent number 9,752,997
- Issue date Sep 5, 2017
- Hitachi, Ltd.
- Yoshihiro Anan
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic element and charged particle beam device using the same
- Patent number 9,601,308
- Issue date Mar 21, 2017
- Hitachi, Ltd.
- Yoshihiro Anan
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam analyzer and analysis method
- Patent number 8,481,932
- Issue date Jul 9, 2013
- Hitachi, Ltd.
- Yoshihiro Anan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-part specimen holder with conductive patterns
- Patent number 8,334,519
- Issue date Dec 18, 2012
- Hitachi, Ltd.
- Shiano Ono
- G01 - MEASURING TESTING
Information Patent Grant
Electric charged particle beam microscopy and electric charged part...
- Patent number 7,633,064
- Issue date Dec 15, 2009
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic electron microscope
- Patent number 7,518,111
- Issue date Apr 14, 2009
- Hitachi, Ltd.
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interference electron microscope
- Patent number 7,417,227
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscopy, electric charged particl...
- Patent number 7,372,051
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,372,029
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,227,144
- Issue date Jun 5, 2007
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection instrument and positron beam apparatus
- Patent number 7,141,790
- Issue date Nov 28, 2006
- Hitachi, Ltd.
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,888,139
- Issue date May 3, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for charged particle beam microscopy
- Patent number 6,838,667
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and observation method using an electron beam
- Patent number 6,750,451
- Issue date Jun 15, 2004
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autoadjusting electron microscope
- Patent number 6,570,156
- Issue date May 27, 2003
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator device and image pickup apparatus using the same
- Patent number 5,932,880
- Issue date Aug 3, 1999
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope with camera system
- Patent number 5,717,207
- Issue date Feb 10, 1998
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,552,602
- Issue date Sep 3, 1996
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device using whiskers
- Patent number 5,362,972
- Issue date Nov 8, 1994
- Hitachi, Ltd.
- Masamitsu Yazawa
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASUREMENT APPARATUS, SAMPLE MEASUREMENT SYSTEM, AND ARTIFI...
- Publication number 20230303961
- Publication date Sep 28, 2023
- Hitachi, Ltd
- Masanari KOGUCHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Substitution Site Measuring Equipment and Substitution Site Measuri...
- Publication number 20190017948
- Publication date Jan 17, 2019
- Hitachi, Ltd.
- Yoshihiro ANAN
- G02 - OPTICS
Information Patent Application
METHOD FOR EVALUATING STRUCTURAL CHANGE DURING PRODUCTION PROCESS,...
- Publication number 20170315091
- Publication date Nov 2, 2017
- Hitachi, Ltd
- Takeshi NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE-BEAM ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20170067838
- Publication date Mar 9, 2017
- Hitachi, Ltd
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ELEMENT AND CHARGED PARTICLE BEAM DEVICE USING THE SAME
- Publication number 20150318144
- Publication date Nov 5, 2015
- Hitachi, Ltd
- Yoshihiro ANAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALCULATION SYSTEM AND CALCULATION METHOD
- Publication number 20150293040
- Publication date Oct 15, 2015
- Hitachi, Ltd
- Koji Aramaki
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM ANALYZER AND ANALYSIS METHOD
- Publication number 20120257720
- Publication date Oct 11, 2012
- Hitachi, Ltd.
- Yoshihiro ANAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFRACTION PATTERN CAPTURING METHOD AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20110049344
- Publication date Mar 3, 2011
- Hitachi, Ltd
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC ELECTRON MICROSCOPE
- Publication number 20090078869
- Publication date Mar 26, 2009
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20080283748
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...
- Publication number 20080093551
- Publication date Apr 24, 2008
- Ruriko TSUNETA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Specimen Analyzing Apparatus and Specimen Holder
- Publication number 20080067374
- Publication date Mar 20, 2008
- Shiano Ono
- G01 - MEASURING TESTING
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20070228277
- Publication date Oct 4, 2007
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20060151701
- Publication date Jul 13, 2006
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning interference electron microscope
- Publication number 20060124850
- Publication date Jun 15, 2006
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electric charged particle beam microscopy, electric charged particl...
- Publication number 20060038125
- Publication date Feb 23, 2006
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection instrument and positron beam apparatus
- Publication number 20040227078
- Publication date Nov 18, 2004
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20030201393
- Publication date Oct 30, 2003
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Observation apparatus and observation method using an electron beam
- Publication number 20030006373
- Publication date Jan 9, 2003
- HITACHI LTD.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Network solution system of analysis and evaluation
- Publication number 20020099573
- Publication date Jul 25, 2002
- Hitachi, Ltd.
- Masanari Koguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for charged particle beam microscopy
- Publication number 20020056808
- Publication date May 16, 2002
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS

Masanari Koguchi

Person

Patents Grantslast 30 patents

Substitution site measuring equipment and substitution site measuri...

Method for evaluating structural change during production process,...

Charged-particle-beam analysis device and analysis method

Spectroscopic element and charged particle beam device using the same

Charged particle beam analyzer and analysis method

Multi-part specimen holder with conductive patterns

Electric charged particle beam microscopy and electric charged part...

Magnetic electron microscope

Scanning interference electron microscope

Electric charged particle beam microscopy, electric charged particl...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Defect inspection instrument and positron beam apparatus

Electron microscope

Method and apparatus for charged particle beam microscopy

Observation apparatus and observation method using an electron beam

Autoadjusting electron microscope

Electron microscope

Scintillator device and image pickup apparatus using the same

Electron microscope

Transmission electron microscope with camera system

Electron microscope

Semiconductor device using whiskers

Patents Applicationslast 30 patents

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

SCANNING PROBE MICROSCOPE

SAMPLE MEASUREMENT APPARATUS, SAMPLE MEASUREMENT SYSTEM, AND ARTIFI...

Substitution Site Measuring Equipment and Substitution Site Measuri...

METHOD FOR EVALUATING STRUCTURAL CHANGE DURING PRODUCTION PROCESS,...

CHARGED-PARTICLE-BEAM ANALYSIS DEVICE AND ANALYSIS METHOD

SPECTROSCOPIC ELEMENT AND CHARGED PARTICLE BEAM DEVICE USING THE SAME

CALCULATION SYSTEM AND CALCULATION METHOD

CHARGED PARTICLE BEAM ANALYZER AND ANALYSIS METHOD

DIFFRACTION PATTERN CAPTURING METHOD AND CHARGED PARTICLE BEAM DEVICE

MAGNETIC ELECTRON MICROSCOPE

Electron microscope

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...

Specimen Analyzing Apparatus and Specimen Holder

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Scanning interference electron microscope

Electric charged particle beam microscopy, electric charged particl...

Defect inspection instrument and positron beam apparatus

Electron microscope

Observation apparatus and observation method using an electron beam

Network solution system of analysis and evaluation

Method and apparatus for charged particle beam microscopy