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Masanari Nakashima
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Hyogo, JP
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Patents Grants
last 30 patents
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Patent Grant
Probe card for examining semiconductor devices on semiconductor wafers
Patent number
7,081,766
Issue date
Jul 25, 2006
Japan Electronic Materials Corp.
Katsuhiko Satou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Connection pin
Publication number
20050093559
Publication date
May 5, 2005
Chikaomi Mori
G01 - MEASURING TESTING
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Patent Application
Probe card substrate
Publication number
20050036374
Publication date
Feb 17, 2005
Masanari Nakashima
G01 - MEASURING TESTING
Information
Patent Application
Probe card
Publication number
20040257098
Publication date
Dec 23, 2004
Katsuhiko Satou
G01 - MEASURING TESTING