Masanobu Higashide

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Abnormality detection system and method of detecting abnormality
- Patent number 8,229,584
- Issue date Jul 24, 2012
- Renesas Electronics Corporation
- Masanobu Higashide
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for detecting abnormal characteristic values c...
- Patent number 7,636,609
- Issue date Dec 22, 2009
- NEC Electronics Corporation
- Masanobu Higashide
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for detecting abnormal characteristic values c...
- Patent number 7,590,465
- Issue date Sep 15, 2009
- NEC Electronics Corporation
- Masanobu Higashide
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Abnormality detection system and method of detecting abnormality
- Publication number 20070203603
- Publication date Aug 30, 2007
- NEC Electronics Corporation
- Masanobu Higashide
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for detecting abnormal characteristic values c...
- Publication number 20070012085
- Publication date Jan 18, 2007
- NEC ELECTRONICS CORPORATION
- Masanobu Higashide
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for detecting abnormal characteristic values c...
- Publication number 20060224267
- Publication date Oct 5, 2006
- NEC Electronics Corporation
- Masanobu Higashide
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for detecting abnormal characteristic values c...
- Publication number 20060206230
- Publication date Sep 14, 2006
- NEC Electronics Corporation
- Masanobu Higashide
- G05 - CONTROLLING REGULATING