Masanori Akatsuka

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing silicon epitaxial wafer
- Patent number 6,599,816
- Issue date Jul 29, 2003
- Sumitomo Metal Industries, Ltd.
- Kouji Sueoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Birefringence distribution measuring method
- Patent number 5,587,793
- Issue date Dec 24, 1996
- Nakai; Sadao
- Sadao Nakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of manufacturing silicon epitaxial wafer
- Publication number 20010021574
- Publication date Sep 13, 2001
- Sumitomo Metal Industries, Ltd.
- Kouji Sueoka
- C30 - CRYSTAL GROWTH