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Masanori Arai
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image pick-up device, image measurement apparatus, non-contact disp...
Patent number
11,193,757
Issue date
Dec 7, 2021
Mitutoyo Corporation
Satoru Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Variable focal length lens
Patent number
D870795
Issue date
Dec 24, 2019
Mitutoyo Corporation
Masaki Okayasu
D16 - Photography and optical equipment
Information
Patent Grant
Variable focal length lens
Patent number
D869542
Issue date
Dec 10, 2019
Mitutoyo Corporation
Masaki Okayasu
D16 - Photography and optical equipment
Information
Patent Grant
Surface texture measuring apparatus
Patent number
10,295,337
Issue date
May 21, 2019
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Double cone stylus, touch probe, and method of calibrating double c...
Patent number
9,341,460
Issue date
May 17, 2016
Mitutoyo Corporation
Masaki Kurihara
G01 - MEASURING TESTING
Information
Patent Grant
Surface roughness measuring unit and coordinate measuring apparatus
Patent number
9,250,053
Issue date
Feb 2, 2016
Mitutoyo Corporation
Kotaro Hirano
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Detection method and detection apparatus
Patent number
8,994,957
Issue date
Mar 31, 2015
Nikon Corporation
Yoshiaki Kito
G01 - MEASURING TESTING
Information
Patent Grant
Coordinates measuring head unit and coordinates measuring machine
Patent number
8,650,767
Issue date
Feb 18, 2014
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Detection method and detection apparatus
Patent number
8,547,559
Issue date
Oct 1, 2013
Nikon Corporation
Yoshiaki Kito
G01 - MEASURING TESTING
Information
Patent Grant
Screw measuring method, screw measuring probe, and screw measuring...
Patent number
7,490,411
Issue date
Feb 17, 2009
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Alignment adjuster of probe, measuring instrument and alignment adj...
Patent number
7,099,008
Issue date
Aug 29, 2006
Mitutoyo Corporation
Yoshihiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus
Patent number
6,812,850
Issue date
Nov 2, 2004
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Vibration-type contact detection sensor
Patent number
6,516,669
Issue date
Feb 11, 2003
Mitutoyo Corporation
Kaoru Matsuki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Collision preventing device for a measuring apparatus and measuring...
Patent number
6,333,696
Issue date
Dec 25, 2001
Mitutoyo Corporation
Sadayuki Matsumiya
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Non-contact surface roughness measuring device
Patent number
6,163,973
Issue date
Dec 26, 2000
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Simple three-dimensional measuring machine
Patent number
5,291,662
Issue date
Mar 8, 1994
Mitutoyo Corporation
Sadayuki Matsumiya
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Drop/insert channel selecting system
Patent number
5,134,609
Issue date
Jul 28, 1992
Fujitsu Limited
Masakazu Mori
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Inner diameter measuring machine
Patent number
4,885,845
Issue date
Dec 12, 1989
Mitutoyo Corporation
Takeshi Yamamoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LASER RADAR
Publication number
20220082697
Publication date
Mar 17, 2022
Nikon Corporation
Anthony SLOTWINSKI
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PICK-UP DEVICE, IMAGE MEASUREMENT APPARATUS, NON-CONTACT DISP...
Publication number
20200208965
Publication date
Jul 2, 2020
MITUTOYO CORPORATION
Satoru YOSHIDA
G02 - OPTICS
Information
Patent Application
SURFACE TEXTURE MEASURING APPARATUS
Publication number
20170248415
Publication date
Aug 31, 2017
MITUTOYO CORPORATION
Sadayuki MATSUMIYA
G01 - MEASURING TESTING
Information
Patent Application
DOUBLE CONE STYLUS, TOUCH PROBE, AND METHOD OF CALIBRATING DOUBLE C...
Publication number
20140109420
Publication date
Apr 24, 2014
MITUTOYO CORPORATION
Masaki KURIHARA
G01 - MEASURING TESTING
Information
Patent Application
SURFACE ROUGHNESS MEASURING UNIT AND COORDINATE MEASURING APPARATUS
Publication number
20140109422
Publication date
Apr 24, 2014
MITUTOYO CORPORATION
Kotaro HIRANO
B82 - NANO-TECHNOLOGY
Information
Patent Application
DETECTION METHOD AND DETECTION APPARATUS
Publication number
20140022560
Publication date
Jan 23, 2014
Nikon Corporation
Yoshiaki KITO
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD AND DETECTION APPARATUS
Publication number
20130033712
Publication date
Feb 7, 2013
Yoshiaki Kito
G01 - MEASURING TESTING
Information
Patent Application
COORDINATES MEASURING HEAD UNIT AND COORDINATES MEASURING MACHINE
Publication number
20120073154
Publication date
Mar 29, 2012
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Application
Optical measuring instrument
Publication number
20090303068
Publication date
Dec 10, 2009
Mitutoyo Corporation
Masanori Arai
G01 - MEASURING TESTING
Information
Patent Application
Calibrating method of image measuring instrument
Publication number
20090141131
Publication date
Jun 4, 2009
Mitutoyo Corporation
Masanori Arai
G01 - MEASURING TESTING
Information
Patent Application
Screw measuring method, screw measuring probe, and screw measuring...
Publication number
20070240318
Publication date
Oct 18, 2007
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Application
Probe observing device and surface texture measuring device
Publication number
20070086620
Publication date
Apr 19, 2007
Mitutoyo Corporation
Masanori Arai
G01 - MEASURING TESTING
Information
Patent Application
Measuring apparatus
Publication number
20030043267
Publication date
Mar 6, 2003
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Application
Alignment adjuster of probe, measuring instrument and alignment adj...
Publication number
20030030807
Publication date
Feb 13, 2003
Mitutoyo Corporation
Yoshihiko Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Vibration-type contact detection sensor
Publication number
20020005062
Publication date
Jan 17, 2002
Kaoru Matsuki
G01 - MEASURING TESTING