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Masanori FUJIWARA

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  • Kyoto, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    VOID DEFECT FORMING METHOD, DEVICE, AND DIAMOND MANUFACTURING METHOD
    • Publication number 20240410083
    • Publication date Dec 12, 2024
    • KYOTO UNIVERSITY
    • Norikazu MIZUOCHI
    • C01 - INORGANIC CHEMISTRY
  • Information Patent Application

    PUMP UNIT FOR CHROMATOGRAPH
    • Publication number 20240159717
    • Publication date May 16, 2024
    • Shimadzu Corporation
    • Masanori FUJIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEMPERATURE SENSITIVE PROBE
    • Publication number 20240044722
    • Publication date Feb 8, 2024
    • DAICEL CORPORATION
    • Masahiro NISHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION SUPPRESSOR
    • Publication number 20220187254
    • Publication date Jun 16, 2022
    • Shimadzu Corporation
    • Katsumasa SAKAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION CHROMATOGRAPH
    • Publication number 20220163495
    • Publication date May 26, 2022
    • Shimadzu Corporation
    • Masanori FUJIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION CHROMATOGRAPH AND ION COMPONENT ANALYSIS METHOD
    • Publication number 20220155265
    • Publication date May 19, 2022
    • Shimadzu Corporation
    • Katsumasa SAKAMOTO
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ION SUPPRESSOR
    • Publication number 20220146476
    • Publication date May 12, 2022
    • Shimadzu Corporation
    • Masanori FUJIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION SUPPRESSOR AND ION CHROMATOGRAPH
    • Publication number 20200132639
    • Publication date Apr 30, 2020
    • Shimadzu Corporation
    • Katsumasa SAKAMOTO
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    MEASUREMENT METHOD USING DIFFERENTIAL REFRACTOMETER, DIFFERENTIAL R...
    • Publication number 20170010213
    • Publication date Jan 12, 2017
    • Shimadzu Corporation
    • Kumiko Jingu
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ANALYZER
    • Publication number 20160313248
    • Publication date Oct 27, 2016
    • Shimadzu Corporation
    • Yusuke NAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    REFRACTIVE INDEX DETECTOR AND LIQUID CHROMATOGRAPH
    • Publication number 20160274074
    • Publication date Sep 22, 2016
    • Shimadzu Corporation
    • Masanori Fujiwara
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ANALYZER
    • Publication number 20160234904
    • Publication date Aug 11, 2016
    • Shimadzu Corporation
    • Yusuke NAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMAGE RECORDING APPARATUS AND METHOD OF DETECTING EJECTION FAILURE...
    • Publication number 20090289985
    • Publication date Nov 26, 2009
    • Dainippon Screen Mfg. Co.,Ltd.
    • Ryuhei SUMIDA
    • B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS