Masanori Gunji

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contamination inspection method and contamination inspection device
- Patent number 9,176,075
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Probe storage container, prober apparatus, probe arranging method a...
- Patent number 7,875,156
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Method and scanning electron microscope for measuring width of mate...
- Patent number 7,385,196
- Issue date Jun 10, 2008
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and scanning electron microscope for measuring dimension of...
- Patent number 6,791,084
- Issue date Sep 14, 2004
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTAMINATION INSPECTION METHOD AND CONTAMINATION INSPECTION DEVICE
- Publication number 20120147364
- Publication date Jun 14, 2012
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Application
Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
- Publication number 20110093991
- Publication date Apr 21, 2011
- Hitachi High-Technologies Corporation
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Application
Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
- Publication number 20080204058
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Masanori GUNJI
- G01 - MEASURING TESTING
Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20050006581
- Publication date Jan 13, 2005
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20030071214
- Publication date Apr 17, 2003
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS