Masanori KOBAYASHI

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Hamamatsu-shi, Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Light irradiation device and sample observation apparatus
- Patent number 12,140,742
- Issue date Nov 12, 2024
- Hamamatsu Photonics K.K.
- Masanori Kobayashi
- G02 - OPTICS
Information Patent Grant
Solid immersion lens unit and semiconductor inspection device
- Patent number 11,913,888
- Issue date Feb 27, 2024
- Hamamatsu Photonics K.K.
- Xiangguang Mao
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation device and sample observation method
- Patent number 11,874,224
- Issue date Jan 16, 2024
- Hamamatsu Photonics K.K.
- Satoshi Yamamoto
- G02 - OPTICS
Information Patent Grant
Sample observation device
- Patent number 11,852,792
- Issue date Dec 26, 2023
- Hamamatsu Photonics K.K.
- Masanori Kobayashi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
LIGHT IRRADIATION DEVICE AND SAMPLE OBSERVATION APPARATUS
- Publication number 20250035901
- Publication date Jan 30, 2025
- HAMAMATSU PHOTONICS K. K.
- Masanori KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT IRRADIATION DEVICE AND SAMPLE OBSERVATION APPARATUS
- Publication number 20230176352
- Publication date Jun 8, 2023
- Hamamatsu Photonics K.K.
- Masanori KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20210333216
- Publication date Oct 28, 2021
- Hamamatsu Photonics K.K.
- Xiangguang MAO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION DEVICE
- Publication number 20210116692
- Publication date Apr 22, 2021
- Hamamatsu Photonics K.K.
- Masanori KOBAYASHI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20200158633
- Publication date May 21, 2020
- Hamamatsu Photonics K.K.
- Satoshi YAMAMOTO
- G01 - MEASURING TESTING