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Masanori KURIMOTO

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Patents Grantslast 30 patents

  • Information Patent Grant

    Gain control amplification device
    • Patent number 10,447,223
    • Issue date Oct 15, 2019
    • Mitsubishi Electric Corporation
    • Masanori Kurimoto
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Deterioration diagnosis device
    • Patent number 10,416,220
    • Issue date Sep 17, 2019
    • Mitsubishi Electric Corporation
    • Masanori Kurimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Driving device
    • Patent number 9,707,908
    • Issue date Jul 18, 2017
    • Mitsubishi Electric Corporation
    • Masanori Kurimoto
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Semiconductor device
    • Patent number 8,028,210
    • Issue date Sep 27, 2011
    • Renesas Electronics Corporation
    • Masanori Kurimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 7,913,139
    • Issue date Mar 22, 2011
    • Renesas Electronics Corporation
    • Masanori Kurimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 7,827,454
    • Issue date Nov 2, 2010
    • Renesas Electronics Corporation
    • Masanori Kurimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Logic simulation apparatus for performing logic simulation in high...
    • Patent number 6,978,429
    • Issue date Dec 20, 2005
    • Renesas Technology Corp.
    • Akira Yoshida
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Timing verification checking value extracting method
    • Patent number 6,789,055
    • Issue date Sep 7, 2004
    • Renesas Technology Corp.
    • Shigeru Kuriyama
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    GAIN CONTROL AMPLIFICATION DEVICE
    • Publication number 20180358944
    • Publication date Dec 13, 2018
    • Mitsubishi Electric Corporation
    • Masanori KURIMOTO
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DETERIORATION DIAGNOSIS DEVICE
    • Publication number 20170356947
    • Publication date Dec 14, 2017
    • Mitsubishi Electric Corporation
    • Masanori KURIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    DRIVING DEVICE
    • Publication number 20170021782
    • Publication date Jan 26, 2017
    • Mitsubishi Electric Corporation
    • Masanori KURIMOTO
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    SEMICONDUCTOR DESIGNING APPARATUS
    • Publication number 20120005641
    • Publication date Jan 5, 2012
    • Renesas Electronics Corporation
    • Masanori KURIMOTO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110296260
    • Publication date Dec 1, 2011
    • RENESAS ELECTRONICS CORPORATION
    • Masanori KURIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110138217
    • Publication date Jun 9, 2011
    • RENESAS ELECTRONICS CORPORATION
    • Masanori KURIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110029829
    • Publication date Feb 3, 2011
    • Renesas Technology Corp.
    • Masanori KURIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090024888
    • Publication date Jan 22, 2009
    • RENESAS TECHNOLOGY CORP.
    • Masanori KURIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Logic simulation apparatus for performing logic simulation in high...
    • Publication number 20040107086
    • Publication date Jun 3, 2004
    • Renesas Technology Corp.
    • Akira Yoshida
    • G06 - COMPUTING CALCULATING COUNTING