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Masanori Tanabe
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Odawara, JP
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last 30 patents
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Patent Grant
Thin film magnetic head and magnetic disk apparatus using the same
Patent number
6,288,871
Issue date
Sep 11, 2001
Hitachi, Ltd.
Masanori Tanabe
G11 - INFORMATION STORAGE
Information
Patent Grant
Large capacity magnetic disc apparatus with a particular relationsh...
Patent number
5,671,107
Issue date
Sep 23, 1997
Hitachi, Ltd.
Katsuya Mitsuoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic disc unit having a plurality of magnetic heads which inclu...
Patent number
5,590,008
Issue date
Dec 31, 1996
Hitachi, Ltd.
Masanori Tanabe
G11 - INFORMATION STORAGE
Information
Patent Grant
Magneto-resistance effect type of recording/reproducing head
Patent number
5,461,517
Issue date
Oct 24, 1995
Hitachi, Ltd.
Mitsuo Suda
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic information storage apparatus including magnetic head and...
Patent number
5,245,493
Issue date
Sep 14, 1993
Hitachi, Ltd.
Takashi Kawabe
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of making silicon diaphragm pressure sensor
Patent number
4,670,969
Issue date
Jun 9, 1987
Hitachi, Ltd.
Kazuji Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Tablet type coordinate input apparatus using elastic wave
Patent number
4,665,282
Issue date
May 12, 1987
Hitachi, Ltd.
Ichiya Sato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Feedback circuit for a semiconductor active element sensor
Patent number
4,633,099
Issue date
Dec 30, 1986
Hitachi, Ltd.
Masanori Tanabe
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure measuring transducer assembly
Patent number
4,364,276
Issue date
Dec 21, 1982
Hitachi, Ltd.
Michitaka Shimazoe
G01 - MEASURING TESTING
Information
Patent Grant
Method of producing semiconductor displacement transducer
Patent number
4,319,397
Issue date
Mar 16, 1982
Hitachi, Ltd.
Masanori Tanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pressure sensitive apparatus
Patent number
4,303,903
Issue date
Dec 1, 1981
Hitachi, Ltd.
Yoshitaka Matsuoka
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor strain gauge with elastic load plate
Patent number
4,292,618
Issue date
Sep 29, 1981
Hitachi, Ltd.
Masanori Tanabe
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure transducer
Patent number
4,173,900
Issue date
Nov 13, 1979
Hitachi, Ltd.
Masanori Tanabe
G01 - MEASURING TESTING