Masanosuke Tanaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive measurement apparatus
- Patent number 11,099,127
- Issue date Aug 24, 2021
- ATAGO CO., LTD.
- Hideyuki Amamiya
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring polarization degree and refractive index
- Patent number 9,709,489
- Issue date Jul 18, 2017
- ATAGO CO., LTD.
- Hideyuki Amamiya
- G01 - MEASURING TESTING
Information Patent Grant
Part of a polarimeter and refractometer
- Patent number D750517
- Issue date Mar 1, 2016
- ATAGO CO., LTD.
- Hideyuki Amamiya
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Polarimeter and refractometer
- Patent number D749969
- Issue date Feb 23, 2016
- ATAGO CO., LTD.
- Hideyuki Amamiya
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
NONDESTRUCTIVE MEASUREMENT APPARATUS
- Publication number 20190003963
- Publication date Jan 3, 2019
- Atago Co., Ltd.
- Hideyuki AMAMIYA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING POLARIZATION DEGREE AND REFRACTIVE INDEX
- Publication number 20170074791
- Publication date Mar 16, 2017
- Atago Co., Ltd.
- Hideyuki AMAMIYA
- G01 - MEASURING TESTING