Masanso Munekane

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample support prepared by semiconductor silicon process technique
- Patent number 7,345,289
- Issue date Mar 18, 2008
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample support prepared by semiconductor silicon process technique
- Publication number 20060189021
- Publication date Aug 24, 2006
- Kouji Iwasaki
- G01 - MEASURING TESTING