Masao Iwase

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory having memory cell regions and other regions a...
- Patent number 11,974,439
- Issue date Apr 30, 2024
- Kioxia Corporation
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory having first and second memory cell regions se...
- Patent number 11,552,095
- Issue date Jan 10, 2023
- Kioxia Corporation
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 10,971,511
- Issue date Apr 6, 2021
- TOSHIBA MEMORY CORPORATION
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 10,622,372
- Issue date Apr 14, 2020
- TOSHIBA MEMORY CORPORATION
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 10,199,387
- Issue date Feb 5, 2019
- TOSHIBA MEMORY CORPORATION
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 10,056,403
- Issue date Aug 21, 2018
- TOSHIBA MEMORY CORPORATION
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 9,768,188
- Issue date Sep 19, 2017
- TOSHIBA MEMORY CORPORATION
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory
- Patent number 9,502,299
- Issue date Nov 22, 2016
- Kabushiki Kaisha Toshiba
- Tomoo Hishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method for manufacturin...
- Patent number 8,786,003
- Issue date Jul 22, 2014
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing nonvolatile semiconductor memory device
- Patent number 8,735,246
- Issue date May 27, 2014
- Kabushiki Kaisha Toshiba
- Shuichi Kuboi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method for manufacturin...
- Patent number 8,247,860
- Issue date Aug 21, 2012
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,241,984
- Issue date Aug 14, 2012
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integral circuit including non-volatile memory cell
- Patent number 7,847,337
- Issue date Dec 7, 2010
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,700,381
- Issue date Apr 20, 2010
- Kabushikia Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleaning method and a cleaning device for cleaning an edge portion...
- Patent number 7,632,358
- Issue date Dec 15, 2009
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of recognizing ID marks appended on base material...
- Patent number 7,613,537
- Issue date Nov 3, 2009
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer and a method for manufacturing a semiconductor...
- Patent number 7,268,053
- Issue date Sep 11, 2007
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer and a method for manufacturing a semiconductor...
- Patent number 7,253,500
- Issue date Aug 7, 2007
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,057,259
- Issue date Jun 6, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer and a method for manufacturing a semiconductor...
- Patent number 7,015,566
- Issue date Mar 21, 2006
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,770,512
- Issue date Jun 23, 1998
- Kabushiki Kaisha Toshiba
- Atsushi Murakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,656,859
- Issue date Aug 12, 1997
- Kabushiki Kaisha Toshiba
- Atsushi Murakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,097,311
- Issue date Mar 17, 1992
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20240251561
- Publication date Jul 25, 2024
- KIOXIA Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20230088310
- Publication date Mar 23, 2023
- KIOXIA Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20210217755
- Publication date Jul 15, 2021
- Toshiba Memory Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20200212053
- Publication date Jul 2, 2020
- Toshiba Memory Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20190164979
- Publication date May 30, 2019
- Toshiba Memory Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20180358368
- Publication date Dec 13, 2018
- Toshiba Memory Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20180006042
- Publication date Jan 4, 2018
- Toshiba Memory Corporation
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20170062441
- Publication date Mar 2, 2017
- Kabushiki Kaisha Toshiba
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20160079266
- Publication date Mar 17, 2016
- KABUSHIKI KAISHA TOSHIBA
- Nozomi KIDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY
- Publication number 20150263024
- Publication date Sep 17, 2015
- Kabushiki Kaisha Toshiba
- Tomoo HISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AN...
- Publication number 20130228841
- Publication date Sep 5, 2013
- Kabushiki Kaisha Toshiba
- Shuichi KUBOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...
- Publication number 20130056816
- Publication date Mar 7, 2013
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20110053363
- Publication date Mar 3, 2011
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cleaning method and a cleaning device for cleaning an edge portion...
- Publication number 20100051073
- Publication date Mar 4, 2010
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080308859
- Publication date Dec 18, 2008
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cleaning method and a cleaning device for cleaning an edge portion...
- Publication number 20060272676
- Publication date Dec 7, 2006
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Publication number 20060131696
- Publication date Jun 22, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer and a method for manufacturing a semiconductor...
- Publication number 20060118916
- Publication date Jun 8, 2006
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system of recognizing ID marks appended on base material...
- Publication number 20050213458
- Publication date Sep 29, 2005
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer and a method for manufacturing a semiconductor...
- Publication number 20050167857
- Publication date Aug 4, 2005
- Kabushiki Kaisha Toshiba
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer and a methd for manufacturing a semiconductor w...
- Publication number 20040129940
- Publication date Jul 8, 2004
- Masao Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Publication number 20030003608
- Publication date Jan 2, 2003
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS

Masao Iwase

Person

Patents Grantslast 30 patents

Semiconductor memory having memory cell regions and other regions a...

Semiconductor memory having first and second memory cell regions se...

Semiconductor memory

Semiconductor memory

Semiconductor memory

Semiconductor memory

Semiconductor memory

Semiconductor memory

Nonvolatile semiconductor memory device and method for manufacturin...

Method for manufacturing nonvolatile semiconductor memory device

Nonvolatile semiconductor memory device and method for manufacturin...

Semiconductor device and method for manufacturing the same

Integral circuit including non-volatile memory cell

Semiconductor wafer with ID mark, equipment for and method of manuf...

Cleaning method and a cleaning device for cleaning an edge portion...

Method and system of recognizing ID marks appended on base material...

Semiconductor wafer and a method for manufacturing a semiconductor...

Semiconductor wafer and a method for manufacturing a semiconductor...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Semiconductor wafer and a method for manufacturing a semiconductor...

Semiconductor device

Semiconductor device

Semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR MEMORY

METHOD FOR MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AN...

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Cleaning method and a cleaning device for cleaning an edge portion...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Cleaning method and a cleaning device for cleaning an edge portion...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Semiconductor wafer and a method for manufacturing a semiconductor...

Method and system of recognizing ID marks appended on base material...

Semiconductor wafer and a method for manufacturing a semiconductor...

Semiconductor wafer and a methd for manufacturing a semiconductor w...

Semiconductor wafer with ID mark, equipment for and method of manuf...