Masao Kawamura

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method based on captured image and inspection device
- Patent number 8,497,985
- Issue date Jul 30, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 8,023,111
- Issue date Sep 20, 2011
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD BASED ON CAPTURED IMAGE AND INSPECTION DEVICE
- Publication number 20100245810
- Publication date Sep 30, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20100066998
- Publication date Mar 18, 2010
- SHIBAURA MECHATRONICS CORPORATION
- Yoshinori Hayashi
- G01 - MEASURING TESTING