Masao Okubo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe card
- Patent number 6,853,208
- Issue date Feb 8, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Gate signal generating circuit, semiconductor evaluation apparatus,...
- Patent number 6,392,459
- Issue date May 21, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe, manufacture of same, and vertically operative type probe car...
- Patent number 6,300,783
- Issue date Oct 9, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a semiconductor integrated circuit
- Patent number 6,294,922
- Issue date Sep 25, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Method of reforming a tip portion of a probe
- Patent number 6,013,169
- Issue date Jan 11, 2000
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for maintaining the position of a probe in high temperat...
- Patent number 5,670,889
- Issue date Sep 23, 1997
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,134,365
- Issue date Jul 28, 1992
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,055,778
- Issue date Oct 8, 1991
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Ion emmissive head and ion beam irradiation device incorporating th...
- Patent number 4,774,413
- Issue date Sep 27, 1988
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fused metal ion source with sintered metal head
- Patent number 4,638,217
- Issue date Jan 20, 1987
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complex probe card for testing a semiconductor wafer
- Patent number 4,523,144
- Issue date Jun 11, 1985
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus of semiconductor wafers
- Patent number 4,518,914
- Issue date May 21, 1985
- Japan Electronic Materials Corportion
- Masao Okubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multilayer wiring board and method of manufacturing the same
- Publication number 20040040739
- Publication date Mar 4, 2004
- Eiji Yoshimura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe for the probe card
- Publication number 20020153913
- Publication date Oct 24, 2002
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe card
- Publication number 20020041189
- Publication date Apr 11, 2002
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING

Masao Okubo

Person

Patents Grantslast 30 patents

Vertical probe card

Gate signal generating circuit, semiconductor evaluation apparatus,...

Probe, manufacture of same, and vertically operative type probe car...

Probe for testing a semiconductor integrated circuit

Method of reforming a tip portion of a probe

Probe card for maintaining the position of a probe in high temperat...

Probe card in which contact pressure and relative position of each...

Probe card in which contact pressure and relative position of each...

Ion emmissive head and ion beam irradiation device incorporating th...

Fused metal ion source with sintered metal head

Complex probe card for testing a semiconductor wafer

Testing apparatus of semiconductor wafers

Patents Applicationslast 30 patents

Multilayer wiring board and method of manufacturing the same

Probe for the probe card

Vertical probe card