Masao Takahashi

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a pad and plurality of interconnects
- Patent number 8,810,039
- Issue date Aug 19, 2014
- Panasonic Corporation
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,669,555
- Issue date Mar 11, 2014
- Panasonic Corporation
- Masao Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrication method for the same
- Patent number 8,450,734
- Issue date May 28, 2013
- Panasonic Corporation
- Masao Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,338,829
- Issue date Dec 25, 2012
- Panasonic Corporation
- Masao Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,237,281
- Issue date Aug 7, 2012
- Panasonic Corporation
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having pads and which minimizes defects due to...
- Patent number 8,102,056
- Issue date Jan 24, 2012
- Panasonic Corporation
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,999,256
- Issue date Aug 16, 2011
- Panasonic Corporation
- Masao Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,888,801
- Issue date Feb 15, 2011
- Panasonic Corporation
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,696,607
- Issue date Apr 13, 2010
- Panasonic Corporation
- Hikari Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,538,433
- Issue date May 26, 2009
- Panasonic Corporation
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Design method for semiconductor integrated circuit suppressing powe...
- Patent number 7,278,124
- Issue date Oct 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer and testing method therefor
- Patent number 7,170,189
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Masao Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130075727
- Publication date Mar 28, 2013
- PANASONIC CORPORATION
- Masao TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM ICONDUCTOR DEVICE HAVING PADS AND WHICH MINIMIZES DEFECTS DUE T...
- Publication number 20120080780
- Publication date Apr 5, 2012
- PANASONIC CORPORATION
- Koji TAKEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110266540
- Publication date Nov 3, 2011
- PANASONIC CORPORATION
- Masao TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110095430
- Publication date Apr 28, 2011
- PANASONIC CORPORATION
- Koji TAKEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DELAY LIBRARY, DELAY LIBRARY CREATION METHOD, AND DELAY CALCULATION...
- Publication number 20100313176
- Publication date Dec 9, 2010
- Masao Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME
- Publication number 20100148173
- Publication date Jun 17, 2010
- PANASONIC CORPORATION
- Masao TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090200677
- Publication date Aug 13, 2009
- PANASONIC CORPORATION
- Koji TAKEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090078935
- Publication date Mar 26, 2009
- Masao Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20080036042
- Publication date Feb 14, 2008
- Hikari Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20070052068
- Publication date Mar 8, 2007
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20070001308
- Publication date Jan 4, 2007
- Koji Takemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer and testing method therefor
- Publication number 20060103408
- Publication date May 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Masao Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Design method for semiconductor integrated circuit suppressing powe...
- Publication number 20050149894
- Publication date Jul 7, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for analyzing power supply noise of semiconductor integrated...
- Publication number 20050114054
- Publication date May 26, 2005
- Kenji Shimazaki
- G01 - MEASURING TESTING

Masao Takahashi

Person

Patents Grantslast 30 patents

Semiconductor device having a pad and plurality of interconnects

Semiconductor device

Semiconductor device and fabrication method for the same

Semiconductor device

Semiconductor device

Semiconductor device having pads and which minimizes defects due to...

Semiconductor device

Semiconductor device

Semiconductor device

Semiconductor device

Design method for semiconductor integrated circuit suppressing powe...

Semiconductor wafer and testing method therefor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEM ICONDUCTOR DEVICE HAVING PADS AND WHICH MINIMIZES DEFECTS DUE T...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

DELAY LIBRARY, DELAY LIBRARY CREATION METHOD, AND DELAY CALCULATION...

SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

Semiconductor device

Semiconductor device

Semiconductor device

Semiconductor wafer and testing method therefor

Design method for semiconductor integrated circuit suppressing powe...

Method for analyzing power supply noise of semiconductor integrated...