Masaru Doi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method
- Patent number 8,601,329
- Issue date Dec 3, 2013
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 7,945,826
- Issue date May 17, 2011
- Advantest Corporation
- Satoshi Kameda
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus for regulating a test signal supplied to a device un...
- Patent number 7,805,641
- Issue date Sep 28, 2010
- Advantest Corporation
- Tatsuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus that tests a plurality of devices under test having...
- Patent number 7,765,449
- Issue date Jul 27, 2010
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection apparatus, detection method, and program
- Patent number 7,640,127
- Issue date Dec 29, 2009
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and selection apparatus
- Patent number 7,634,695
- Issue date Dec 15, 2009
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-strobe generation apparatus, test apparatus and adjustment me...
- Patent number 7,461,316
- Issue date Dec 2, 2008
- Advantest Corporation
- Takashi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-strobe apparatus, testing apparatus, and adjusting method
- Patent number 7,406,646
- Issue date Jul 29, 2008
- Advantest Corporation
- Shinya Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus and testing method
- Patent number 7,363,556
- Issue date Apr 22, 2008
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for testing semiconductor device
- Patent number 7,283,920
- Issue date Oct 16, 2007
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and a testing method
- Patent number 7,216,271
- Issue date May 8, 2007
- Advantest Corporation
- Kouichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator, test apparatus and skew adjusting method
- Patent number 7,203,611
- Issue date Apr 10, 2007
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating timing clock
- Patent number 7,190,174
- Issue date Mar 13, 2007
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator and test apparatus
- Patent number 7,010,729
- Issue date Mar 7, 2006
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus
- Patent number 6,990,613
- Issue date Jan 24, 2006
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110258491
- Publication date Oct 20, 2011
- Advantest Corporation
- Masaru DOI
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20090327822
- Publication date Dec 31, 2009
- Advantest Corporation
- Satoshi KAMEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND SELECTION APPARATUS
- Publication number 20080244340
- Publication date Oct 2, 2008
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Application
Test apparatus and test method
- Publication number 20080052584
- Publication date Feb 28, 2008
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus and test method
- Publication number 20070300114
- Publication date Dec 27, 2007
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, test method, and program
- Publication number 20070266290
- Publication date Nov 15, 2007
- Advantest Corporation
- Tatsuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method
- Publication number 20070136628
- Publication date Jun 14, 2007
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Application
Method for calibrating timing clock
- Publication number 20060284621
- Publication date Dec 21, 2006
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Timing generator, test apparatus and skew adjusting method
- Publication number 20060041772
- Publication date Feb 23, 2006
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Multi-strobe generation apparatus, test apparatus and adjustment me...
- Publication number 20050271179
- Publication date Dec 8, 2005
- Advantest Corporation
- Takashi Hasegawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Detection apparatus, detection method, and program
- Publication number 20050259556
- Publication date Nov 24, 2005
- Advantest Corporation
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and a testing method
- Publication number 20050249001
- Publication date Nov 10, 2005
- Advantest Corporation
- Kouichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus
- Publication number 20040251914
- Publication date Dec 16, 2004
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Timing generator and test apparatus
- Publication number 20040208048
- Publication date Oct 21, 2004
- Masaru Doi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing semiconductor device
- Publication number 20040122620
- Publication date Jun 24, 2004
- Masaru Doi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Test apparatus and test method

Test apparatus and test method

Test apparatus for regulating a test signal supplied to a device un...

Test apparatus that tests a plurality of devices under test having...

Detection apparatus, detection method, and program

Test apparatus and selection apparatus

Multi-strobe generation apparatus, test apparatus and adjustment me...

Multi-strobe apparatus, testing apparatus, and adjusting method

Testing apparatus and testing method

Apparatus and method for testing semiconductor device

Testing apparatus and a testing method

Timing generator, test apparatus and skew adjusting method

Method for calibrating timing clock

Timing generator and test apparatus

Test apparatus

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND SELECTION APPARATUS

Test apparatus and test method

Test apparatus and test method

Test apparatus, test method, and program

Testing apparatus and testing method

Method for calibrating timing clock

Timing generator, test apparatus and skew adjusting method

Multi-strobe generation apparatus, test apparatus and adjustment me...

Detection apparatus, detection method, and program

Testing apparatus and a testing method

Test apparatus

Timing generator and test apparatus

Apparatus and method for testing semiconductor device