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Masaru Goishi

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Patents Grantslast 30 patents

  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,743,702
    • Issue date Jun 3, 2014
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,692,566
    • Issue date Apr 8, 2014
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,666,691
    • Issue date Mar 4, 2014
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,483,073
    • Issue date Jul 9, 2013
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test module and test method
    • Patent number 8,418,011
    • Issue date Apr 9, 2013
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test apparatus additional module and test method
    • Patent number 8,362,791
    • Issue date Jan 29, 2013
    • Advantest Corporation
    • Motoo Ueda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,165,027
    • Issue date Apr 24, 2012
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,149,721
    • Issue date Apr 3, 2012
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,059,547
    • Issue date Nov 15, 2011
    • Advantest Corporation
    • Masaru Goishi
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and electronic device
    • Patent number 7,623,984
    • Issue date Nov 24, 2009
    • Advantest Corporation
    • Masaru Goishi
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Test apparatus and electronic device
    • Patent number 7,539,592
    • Issue date May 26, 2009
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pattern generator and test apparatus
    • Patent number 7,363,566
    • Issue date Apr 22, 2008
    • Advantest Corporation
    • Masaru Goishi
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Phase adjustment apparatus and semiconductor test apparatus
    • Patent number 7,336,714
    • Issue date Feb 26, 2008
    • Advantest Corporation
    • Masaru Goishi
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Test apparatus and control method
    • Patent number 7,236,903
    • Issue date Jun 26, 2007
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pattern generator
    • Patent number 6,249,533
    • Issue date Jun 19, 2001
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Memory test set
    • Patent number 6,061,813
    • Issue date May 9, 2000
    • Advantest Corporation
    • Masaru Goishi
    • G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20120133380
    • Publication date May 31, 2012
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND DEBUG METHOD
    • Publication number 20120136603
    • Publication date May 31, 2012
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20110288810
    • Publication date Nov 24, 2011
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST MODULE AND TEST METHOD
    • Publication number 20110276830
    • Publication date Nov 10, 2011
    • Advantest Corporation
    • Masaru GOISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20110137606
    • Publication date Jun 9, 2011
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142393
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142383
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • MASARU GOISHI
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142391
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142392
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD
    • Publication number 20100102840
    • Publication date Apr 29, 2010
    • Advantest Corporation
    • Motoo UEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS AND ELECTRONIC DEVICE
    • Publication number 20080234969
    • Publication date Sep 25, 2008
    • Advantest Corporation
    • Masaru Goishi
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND ELECTRONIC DEVICE
    • Publication number 20080232538
    • Publication date Sep 25, 2008
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS AND ELECTRONIC DEVICE
    • Publication number 20080234965
    • Publication date Sep 25, 2008
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Pattern generator and test apparatus
    • Publication number 20060271832
    • Publication date Nov 30, 2006
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test apparatus and control method
    • Publication number 20050270038
    • Publication date Dec 8, 2005
    • Advantest Corporation
    • Masaru Goishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Phase adjustment apparatus and semiconductor test apparatus
    • Publication number 20050053162
    • Publication date Mar 10, 2005
    • Masaru Goishi
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE