Masaru Haraguchi

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitor device and manufacturing method therefor
- Patent number 12,317,521
- Issue date May 27, 2025
- AP Memory Technology Corp.
- Masaru Haraguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit assembly
- Patent number 12,074,103
- Issue date Aug 27, 2024
- AP Memory Technology Corp.
- Wenliang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,417,628
- Issue date Aug 16, 2022
- AP Memory Technology Corporation
- Wenliang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit assembly
- Patent number 11,380,614
- Issue date Jul 5, 2022
- AP Memory Technology Corp.
- Wenliang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 11,200,945
- Issue date Dec 14, 2021
- Zentel Japan Corporation
- Takashi Kubo
- G11 - INFORMATION STORAGE
Information Patent Grant
Capacitor device and manufacturing method therefor
- Patent number 11,038,012
- Issue date Jun 15, 2021
- AP Memory Technology Corp.
- Masaru Haraguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device comprising an interface conforming to J...
- Patent number 10,991,418
- Issue date Apr 27, 2021
- Zentel Japan Corporation
- Masaru Haraguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device for preventing occurrence of row hammer...
- Patent number 10,818,337
- Issue date Oct 27, 2020
- Zentel Japan Corporation
- Bunsho Kuramori
- G11 - INFORMATION STORAGE
Information Patent Grant
Data processing device and data processing method thereof
- Patent number 9,558,151
- Issue date Jan 31, 2017
- Renesas Electronics Corporation
- Kan Murata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing system, microcontroller and semiconductor device
- Patent number 9,360,922
- Issue date Jun 7, 2016
- Renesas Electronics Corporation
- Masaru Haraguchi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device which transmits or receives a signal to or fro...
- Patent number 7,983,112
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Interface circuit
- Patent number 7,724,606
- Issue date May 25, 2010
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and impedance adjusting method thereof
- Patent number 7,535,251
- Issue date May 19, 2009
- Renesas Technology Corp.
- Chikayoshi Morishima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory device storing redundant replacement informati...
- Patent number 7,433,251
- Issue date Oct 7, 2008
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device storing redundant replacement informati...
- Patent number 7,254,069
- Issue date Aug 7, 2007
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with common I/O type circuit configurat...
- Patent number 7,064,993
- Issue date Jun 20, 2006
- Renesas Technology Corp.
- Takayuki Gyohten
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit capable of testing embedded memory with reliability
- Patent number 7,007,215
- Issue date Feb 28, 2006
- Renesas Technology Corp.
- Mitsuya Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with read and/or write column select gate
- Patent number 6,930,940
- Issue date Aug 16, 2005
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with power consumption reduced in non-d...
- Patent number 6,781,903
- Issue date Aug 24, 2004
- Renesas Technology Corp.
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for reducing test time and semiconductor memory device incl...
- Patent number 6,779,139
- Issue date Aug 17, 2004
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test circuit for testing a semiconductor memory devic...
- Patent number 6,704,229
- Issue date Mar 9, 2004
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit device capable of identifying error in stored data at...
- Patent number 6,650,583
- Issue date Nov 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having write column select gate
- Patent number 6,643,214
- Issue date Nov 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiko Taito
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,496,429
- Issue date Dec 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yasumitsu Murai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,449,198
- Issue date Sep 10, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kei Hamade
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 6,285,622
- Issue date Sep 4, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous semiconductor integrated circuit capable of improving i...
- Patent number 6,240,045
- Issue date May 29, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT ASSEMBLY
- Publication number 20240371747
- Publication date Nov 7, 2024
- AP Memory Technology Corp.
- Wenliang CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT ASSEMBLY
- Publication number 20220302021
- Publication date Sep 22, 2022
- AP Memory Technology Corp.
- Wenliang CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20210398943
- Publication date Dec 23, 2021
- AP MEMORY TECHNOLOGY CORPORATION
- WENLIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20210050410
- Publication date Feb 18, 2021
- AP Memory Technology Corp.
- Masaru HARAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20200402951
- Publication date Dec 24, 2020
- AP MEMORY TECHNOLOGY CORPORATION
- WENLIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT ASSEMBLY
- Publication number 20200402903
- Publication date Dec 24, 2020
- AP Memory Technology Corp.
- Wenliang CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL DEVICE, SEMICONDUCTOR MEMORY DEVICE AND CONTROL METHOD FOR...
- Publication number 20200135261
- Publication date Apr 30, 2020
- Zentel Japan Corporation
- Masaru Haraguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAPACITOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20200098853
- Publication date Mar 26, 2020
- Zentel Japan Corporation
- Masaru HARAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20190378561
- Publication date Dec 12, 2019
- Zentel Japan Corporation
- TAKASHI KUBO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE FOR PREVENTING OCCURANCE OF ROW HAMMER...
- Publication number 20190362774
- Publication date Nov 28, 2019
- Zentel Japan Corporation
- Bunsho KURAMORI
- G11 - INFORMATION STORAGE
Information Patent Application
DATA PROCESSING SYSTEM, MICROCONTROLLER AND SEMICONDUCTOR DEVICE
- Publication number 20150095684
- Publication date Apr 2, 2015
- Renesas Electronics Corporation
- Masaru HARAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING SYSTEM
- Publication number 20150095672
- Publication date Apr 2, 2015
- Renesas Electronics Corporation
- Masaru HARAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING DEVICE AND DATA PROCESSING METHOD THEREOF
- Publication number 20120265964
- Publication date Oct 18, 2012
- Renesas Electronics Corporation
- Kan MURATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSOR AND IMAGE PROCESSING SYSTEM USING THE SAME
- Publication number 20120113271
- Publication date May 10, 2012
- Renesas Electronics Corporation
- Masaru Haraguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE CIRCUIT
- Publication number 20100257324
- Publication date Oct 7, 2010
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20080181047
- Publication date Jul 31, 2008
- RENESAS TECHNOLOGY CORP.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTING METHOD THEREOF
- Publication number 20080068040
- Publication date Mar 20, 2008
- Chikayoshi Morishima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Interface circuit
- Publication number 20080031079
- Publication date Feb 7, 2008
- Renesas Technology Corp.
- Tokuya Osawa
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE STORING REDUNDANT REPLACEMENT INFORMATI...
- Publication number 20070242506
- Publication date Oct 18, 2007
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device with common I/O type circuit configurat...
- Publication number 20040213064
- Publication date Oct 28, 2004
- RENESAS TECHNOLOGY CORP.
- Takayuki Gyohten
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device with read and/or write column select gate
- Publication number 20040196692
- Publication date Oct 7, 2004
- RENESAS TECHNOLOGY CORPORATION
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device with power consumption reduced in non-d...
- Publication number 20040081009
- Publication date Apr 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device storing redundant replacement informati...
- Publication number 20040022110
- Publication date Feb 5, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having write column select gate
- Publication number 20030123310
- Publication date Jul 3, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiko Taito
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit device capable of identifying error in stored data at...
- Publication number 20030043664
- Publication date Mar 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor test circuit for testing a semiconductor memory devic...
- Publication number 20030043663
- Publication date Mar 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit capable of testing embedded memory with reliability
- Publication number 20030018939
- Publication date Jan 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuya Kinoshita
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20020131307
- Publication date Sep 19, 2002
- Mitsubishi Denki Kabushiki Kaisha,
- Yasumitsu Murai
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit for reducing test time and semiconductor memory device incl...
- Publication number 20020056061
- Publication date May 9, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G01 - MEASURING TESTING

Masaru Haraguchi

Person

Patents Grantslast 30 patents

Capacitor device and manufacturing method therefor

Circuit assembly

Method for manufacturing semiconductor structure

Circuit assembly

Semiconductor memory device

Capacitor device and manufacturing method therefor

Semiconductor memory device comprising an interface conforming to J...

Semiconductor memory device for preventing occurrence of row hammer...

Data processing device and data processing method thereof

Data processing system, microcontroller and semiconductor device

Semiconductor device which transmits or receives a signal to or fro...

Interface circuit

Semiconductor device and impedance adjusting method thereof

Semiconductor memory device storing redundant replacement informati...

Semiconductor memory device storing redundant replacement informati...

Semiconductor memory device with common I/O type circuit configurat...

Test circuit capable of testing embedded memory with reliability

Semiconductor memory device with read and/or write column select gate

Semiconductor memory device with power consumption reduced in non-d...

Circuit for reducing test time and semiconductor memory device incl...

Semiconductor test circuit for testing a semiconductor memory devic...

Test circuit device capable of identifying error in stored data at...

Semiconductor memory device having write column select gate

Semiconductor memory device

Semiconductor memory device

Semiconductor device

Synchronous semiconductor integrated circuit capable of improving i...

Patents Applicationslast 30 patents

CIRCUIT ASSEMBLY

CIRCUIT ASSEMBLY

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

CAPACITOR DEVICE AND MANUFACTURING METHOD THEREFOR

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

CIRCUIT ASSEMBLY

CONTROL DEVICE, SEMICONDUCTOR MEMORY DEVICE AND CONTROL METHOD FOR...

CAPACITOR DEVICE AND MANUFACTURING METHOD THEREFOR

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE FOR PREVENTING OCCURANCE OF ROW HAMMER...

DATA PROCESSING SYSTEM, MICROCONTROLLER AND SEMICONDUCTOR DEVICE

DATA PROCESSING SYSTEM

DATA PROCESSING DEVICE AND DATA PROCESSING METHOD THEREOF

PROCESSOR AND IMAGE PROCESSING SYSTEM USING THE SAME

INTERFACE CIRCUIT

Semiconductor device

SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTING METHOD THEREOF

Interface circuit

SEMICONDUCTOR MEMORY DEVICE STORING REDUNDANT REPLACEMENT INFORMATI...

Semiconductor memory device with common I/O type circuit configurat...

Semiconductor memory device with read and/or write column select gate

Semiconductor memory device with power consumption reduced in non-d...

Semiconductor memory device storing redundant replacement informati...

Semiconductor memory device having write column select gate

Test circuit device capable of identifying error in stored data at...

Semiconductor test circuit for testing a semiconductor memory devic...

Test circuit capable of testing embedded memory with reliability

SEMICONDUCTOR MEMORY DEVICE

Circuit for reducing test time and semiconductor memory device incl...