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Masaru Ichihara
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Osaka-fu, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
7,099,432
Issue date
Aug 29, 2006
Matsushita Electric Industrial Co., Ltd.
Masaru Ichihara
G01 - MEASURING TESTING
Information
Patent Grant
Connection inspecting apparatus, connection inspecting method, and...
Patent number
6,872,949
Issue date
Mar 29, 2005
Matsushita Electric Industrial Co., Ltd.
Seiji Mizuoka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-ray inspection apparatus and X-ray inspection method
Publication number
20050074088
Publication date
Apr 7, 2005
Matsushita Electric Industrial Co., Ltd.
Masaru Ichihara
G01 - MEASURING TESTING
Information
Patent Application
Connection inspecting apparatus, connection inspecting method, and...
Publication number
20010040217
Publication date
Nov 15, 2001
Seiji Mizuoka
G01 - MEASURING TESTING